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Sensitive Phonon-Based Probe for Structure Identification of 1T ' MoTe2
Zhou, Lin; Huang, Shengxi; Tatsumi, Yuki; Wu, Lijun; Guo, Huaihong; Bie, Ya-Qing; Ueno, Keiji; Yang, Teng; Zhu, Yimei; Kong, Jing; Saito, Riichiro f; Dresselhaus, Mildred; Huang, SX; Kong, J (reprint author), MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA.; Saito, R (reprint author), Tohoku Univ, Dept Phys, Sendai, Miyagi 9808578, Japan.
2017-06-28
发表期刊JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
ISSN0002-7863
卷号139期号:25页码:8396-8399
摘要In this work, by combining transmission electron microscopy and polarized Raman spectroscopy for the 1T' MoTe2 flakes with different thicknesses, we found that the polarization dependence of Raman intensity is given as a function of excitation laser wavelength, phonon symmetry, and phonon frequency, but has weak dependence on the flake thickness from few-layer to multilayer. In addition, the frequency of Raman peaks and the relative Raman intensity are sensitive to flake thickness, which manifests Raman spectroscopy as an effective probe for thickness of 1T' MoTe2. Our work demonstrates that polarized Raman spectroscopy is a powerful and nondestructive method to quickly identify the crystal structure and thickness of 1T' MoTe2 simultaneously, which opens up opportunities for the in situ probe of anisotropic properties and broad applications of this novel material.; In this work, by combining transmission electron microscopy and polarized Raman spectroscopy for the 1T' MoTe2 flakes with different thicknesses, we found that the polarization dependence of Raman intensity is given as a function of excitation laser wavelength, phonon symmetry, and phonon frequency, but has weak dependence on the flake thickness from few-layer to multilayer. In addition, the frequency of Raman peaks and the relative Raman intensity are sensitive to flake thickness, which manifests Raman spectroscopy as an effective probe for thickness of 1T' MoTe2. Our work demonstrates that polarized Raman spectroscopy is a powerful and nondestructive method to quickly identify the crystal structure and thickness of 1T' MoTe2 simultaneously, which opens up opportunities for the in situ probe of anisotropic properties and broad applications of this novel material.
部门归属[zhou, lin ; huang, shengxi ; kong, jing ; dresselhaus, mildred] mit, dept elect engn & comp sci, cambridge, ma 02139 usa ; [tatsumi, yuki ; saito, riichiro f] tohoku univ, dept phys, sendai, miyagi 9808578, japan ; [wu, lijun ; zhu, yimei] brookhaven natl lab, condensed matter phys & mat sci dept, upton, ny 11973 usa ; [guo, huaihong] liaoning shihua univ, coll sci, fushun 113001, peoples r china ; [bie, ya-qing ; dresselhaus, mildred] mit, dept phys, cambridge, ma 02139 usa ; [ueno, keiji] saitama univ, dept chem, grad sch sci & engn, saitama 3388570, japan ; [yang, teng] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china
学科领域Chemistry, Multidisciplinary
资助者STC Center for Integrated Quantum Materials, NSF [DMR-1231319, EFRI 2-DARE(EFMA-1542815)]; NSF [DMR-1507806]; U.S. Army Research Office through MIT Institute for Soldier Nanotechnologies [023674]; Solid-State Solar-Thermal Energy Conversion Center (S3TEC), an Energy Frontier Research Center - DOE, Office of Science, BES [DE-SC0001299, DE-FG02-09ER46577]; NSFC [1331006, U1537204]; JSPS KAKENHI [JP25286005, JP25107005, JP15K21722]; U.S. Department of Energy, Office of Basic Energy Science, Division of Materials Science and Engineering [DE-SC0012704]
收录类别SCI
语种英语
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/78075
专题中国科学院金属研究所
通讯作者Huang, SX; Kong, J (reprint author), MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA.; Saito, R (reprint author), Tohoku Univ, Dept Phys, Sendai, Miyagi 9808578, Japan.
推荐引用方式
GB/T 7714
Zhou, Lin,Huang, Shengxi,Tatsumi, Yuki,et al. Sensitive Phonon-Based Probe for Structure Identification of 1T ' MoTe2[J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY,2017,139(25):8396-8399.
APA Zhou, Lin.,Huang, Shengxi.,Tatsumi, Yuki.,Wu, Lijun.,Guo, Huaihong.,...&Saito, R .(2017).Sensitive Phonon-Based Probe for Structure Identification of 1T ' MoTe2.JOURNAL OF THE AMERICAN CHEMICAL SOCIETY,139(25),8396-8399.
MLA Zhou, Lin,et al."Sensitive Phonon-Based Probe for Structure Identification of 1T ' MoTe2".JOURNAL OF THE AMERICAN CHEMICAL SOCIETY 139.25(2017):8396-8399.
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