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一种力电热多场耦合下微电子产品可靠性测试方法
郭敬东,祝清省,刘志权,崔学顺,吴迪,张磊,曹丽华
2016-05-25
Rights Holder郭敬东,祝清省,刘志权,崔学顺,吴迪,张磊,曹丽华
Date Available2016-05-25
Country中国
Subtype发明
Abstract一种力电热多场耦合下微电子产品可靠性测试方法
description.department中国科学院金属研究所
Application Date2012-12-21
Language中文
Application Number201210563466.3
Document Type专利
Identifierhttp://ir.imr.ac.cn/handle/321006/78771
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
郭敬东,祝清省,刘志权,崔学顺,吴迪,张磊,曹丽华. 一种力电热多场耦合下微电子产品可靠性测试方法[P]. 2016-05-25.
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