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测定晶内第二相在基体中分布均匀性的方法
李阁平; 张利峰; 李明远; 王练; 彭胜; 吴松全; 高博; 顾恒飞; 庞丽侠
2016-08-17
Rights Holder李阁平 ; 张利峰 ; 李明远 ; 王练 ; 彭胜 ; 吴松全 ; 高博 ; 顾恒飞 ; 庞丽侠
Date Available2016-08-17
Country中国
Subtype发明
Abstract测定晶内第二相在基体中分布均匀性的方法
description.department中国科学院金属研究所
Application Date2013-10-29
Language中文
Application Number201310525910.7 
Document Type专利
Identifierhttp://ir.imr.ac.cn/handle/321006/78806
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
李阁平,张利峰,李明远,等. 测定晶内第二相在基体中分布均匀性的方法[P]. 2016-08-17.
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