IMR OpenIR
CT机X射线防护箱体裂纹成因分析
高金柱; 盖秀颖
2017-10-08
Source Publication理化检验(物理分册)
Issue10Pages:761-764
Abstract某CT机X射线防护箱体在安装过程中发现裂纹,为了找出裂纹产生的原因,利用体视显微镜、直读光谱仪、光学显微镜、扫描电子显微镜等仪器对箱体的断口形貌、化学成分和显微组织等进行了观察和分析。结果表明:该X射线防护箱体上的裂纹是在铸造后、热处理之前或热处理过程中产生的,裂纹的产生与该部位存在较严重的疏松缺陷和较发达的枝晶组织有关,这不仅降低了箱体材料的强度和韧性,而且增加了材料内部的残余应力。
description.department中国科学院金属研究所
KeywordX射线防护箱体 裂纹 疏松 枝晶
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/78887
Collection中国科学院金属研究所
Corresponding Author高金柱
Recommended Citation
GB/T 7714
高金柱,盖秀颖. CT机X射线防护箱体裂纹成因分析[J]. 理化检验(物理分册),2017(10):761-764.
APA 高金柱,&盖秀颖.(2017).CT机X射线防护箱体裂纹成因分析.理化检验(物理分册)(10),761-764.
MLA 高金柱,et al."CT机X射线防护箱体裂纹成因分析".理化检验(物理分册) .10(2017):761-764.
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