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High coercivity and squareness realized in polycrystalline AlN-buffered Cu-doped Sm-Co thin films with perpendicular anisotropy
Zhang, Tongbo; Yang, Yang; Xie, Yigao; Fu, Yanqing; Cui, Weibin; Zhao, Xinguo; Liu, Wei; Zhang, Zhidong; Wang, Qiang; Cui, WB; Wang, Q (reprint author), Northeastern Univ, Minist Educ, Key Lab Electromagnet Proc Mat, Shenyang 110819, Liaoning, Peoples R China.
2017-12-30
Source PublicationELSEVIER SCIENCE SA
ISSN0925-8388
Volume729Pages:533-537
AbstractA polycrystalline AlN underlayer prepared by reactive sputtering has been used for the preparation of SmCo3.5Cu0.5 thin films with varying thickness. The out-of-plane (OOP) texture is confirmed by X-ray diffraction and magnetic measurements. A highest ambient coercivity of 2.92 T is obtained with good squareness. The microstructure shows columnar grains and a high density of stacking faults. Additionally, a twinning structure is found. The thermal stability of the coercivity of AlN-buffered SmCo3.5Cu0.5 thin films has been investigated in correlation with the microstructure. The present work demonstrates the great potential of using AlN underlayer for the preparation high-performance Sm-(Co, Cu) thin films with OOP texture. (C) 2017 Elsevier B.V. All rights reserved.; A polycrystalline AlN underlayer prepared by reactive sputtering has been used for the preparation of SmCo3.5Cu0.5 thin films with varying thickness. The out-of-plane (OOP) texture is confirmed by X-ray diffraction and magnetic measurements. A highest ambient coercivity of 2.92 T is obtained with good squareness. The microstructure shows columnar grains and a high density of stacking faults. Additionally, a twinning structure is found. The thermal stability of the coercivity of AlN-buffered SmCo3.5Cu0.5 thin films has been investigated in correlation with the microstructure. The present work demonstrates the great potential of using AlN underlayer for the preparation high-performance Sm-(Co, Cu) thin films with OOP texture. (C) 2017 Elsevier B.V. All rights reserved.
description.department[zhang, tongbo ; yang, yang ; xie, yigao ; fu, yanqing ; cui, weibin ; wang, qiang] northeastern univ, minist educ, key lab electromagnet proc mat, shenyang 110819, liaoning, peoples r china ; [zhang, tongbo ; yang, yang ; xie, yigao ; fu, yanqing ; cui, weibin] northeastern univ, sch mat sci & engn, dept phys & chem mat, shenyang 110819, liaoning, peoples r china ; [zhao, xinguo ; liu, wei ; zhang, zhidong] inst met res imr, shenyang natl lab synl mat sci, shenyang 110016, liaoning, peoples r china
KeywordMagnetic Films And Multilayers Anisotropy Magnetic Measurements Transmission Electron Microscopy
Subject AreaChemistry, Physical ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
Funding OrganizationNational Key Research and Development Program of China [2016YFB0700901]; National Natural Science Foundation of China [51501033, 51471167, 51590883]; National Natural Science Funds for Distinguished Young Scholars [51425401]; Fundamental Research Funds for the Central Universities [140901001]
Indexed BySCI
Language英语
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/78921
Collection中国科学院金属研究所
Corresponding AuthorCui, WB; Wang, Q (reprint author), Northeastern Univ, Minist Educ, Key Lab Electromagnet Proc Mat, Shenyang 110819, Liaoning, Peoples R China.
Recommended Citation
GB/T 7714
Zhang, Tongbo,Yang, Yang,Xie, Yigao,et al. High coercivity and squareness realized in polycrystalline AlN-buffered Cu-doped Sm-Co thin films with perpendicular anisotropy[J]. ELSEVIER SCIENCE SA,2017,729:533-537.
APA Zhang, Tongbo.,Yang, Yang.,Xie, Yigao.,Fu, Yanqing.,Cui, Weibin.,...&Wang, Q .(2017).High coercivity and squareness realized in polycrystalline AlN-buffered Cu-doped Sm-Co thin films with perpendicular anisotropy.ELSEVIER SCIENCE SA,729,533-537.
MLA Zhang, Tongbo,et al."High coercivity and squareness realized in polycrystalline AlN-buffered Cu-doped Sm-Co thin films with perpendicular anisotropy".ELSEVIER SCIENCE SA 729(2017):533-537.
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