Development of growth and thermal stresses in NiO scale on pure Ni: The metal nanocrystallization effect

IMR OpenIR

	Development of growth and thermal stresses in NiO scale on pure Ni: The metal nanocrystallization effect
	Wei, X.; Peng, X.; Wang, X.; Dong, Z.; Peng, X (reprint author), Nanchang Hongkong Univ, Sch Mat Sci & Engn, 696 Fenghenan Ave, Nanchang 330063, Jiangxi, Peoples R China.
	2017-12-01
发表期刊	PERGAMON-ELSEVIER SCIENCE LTD
ISSN	0010-938X
卷号	129 页码:226-236
摘要	Ni sheet samples with one side normally coarse-grained and the other side nano-grained have been prepared for two-sided oxidation deflection testing. The sample is sharply deflected during heating up to 800 degrees C in air, because of a significant nano-grain growth. Deflection also occurs during the subsequent isothermal oxidation and cooling, due to the difference in the development of the growth and thermal stresses in the thermally-grown NiO on the nanocrystalline Ni. The latter is interpreted based on the investigation of the Ni nanocrystallization effect on the evolution of the microstructure of the NiO scale with time.; Ni sheet samples with one side normally coarse-grained and the other side nano-grained have been prepared for two-sided oxidation deflection testing. The sample is sharply deflected during heating up to 800 degrees C in air, because of a significant nano-grain growth. Deflection also occurs during the subsequent isothermal oxidation and cooling, due to the difference in the development of the growth and thermal stresses in the thermally-grown NiO on the nanocrystalline Ni. The latter is interpreted based on the investigation of the Ni nanocrystallization effect on the evolution of the microstructure of the NiO scale with time.
部门归属	[wei, x.] univ chinese acad sci, beijing 110049, peoples r china ; [peng, x.] nanchang hongkong univ, sch mat sci & engn, 696 fenghenan ave, nanchang 330063, jiangxi, peoples r china ; [wei, x. ; peng, x. ; wang, x. ; dong, z.] chinese acad sci, inst met res, lab corros & protect, shenyang 110016, liaoning, peoples r china
关键词	Nickel Sem Tem Oxidation Electrodeposited Films Effects Of Strain
学科领域	Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
资助者	National Natural Science Foundation of China (NSFC) [51271189]
收录类别	SCI
语种	英语
WOS记录号	WOS:000416190800021
引用统计	被引频次：3[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/78952
专题	中国科学院金属研究所
通讯作者	Peng, X (reprint author), Nanchang Hongkong Univ, Sch Mat Sci & Engn, 696 Fenghenan Ave, Nanchang 330063, Jiangxi, Peoples R China.
推荐引用方式 GB/T 7714	Wei, X.,Peng, X.,Wang, X.,et al. Development of growth and thermal stresses in NiO scale on pure Ni: The metal nanocrystallization effect[J]. PERGAMON-ELSEVIER SCIENCE LTD,2017,129:226-236.
APA	Wei, X.,Peng, X.,Wang, X.,Dong, Z.,&Peng, X .(2017).Development of growth and thermal stresses in NiO scale on pure Ni: The metal nanocrystallization effect.PERGAMON-ELSEVIER SCIENCE LTD,129,226-236.
MLA	Wei, X.,et al."Development of growth and thermal stresses in NiO scale on pure Ni: The metal nanocrystallization effect".PERGAMON-ELSEVIER SCIENCE LTD 129(2017):226-236.