Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor

IMR OpenIR

	Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor
	Hou, J. P.; Chen, Q. Y.; Wang, Q.; Yu, H. Y.; Zhang, Z. J.; Li, R.; Li, X. W.; Zhang, Z. F.; Wang, Q; Zhang, ZF (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
	2017-11-07
发表期刊	ELSEVIER SCIENCE SA
ISSN	0921-5093
卷号	707 页码:511-517
摘要	Strength degradation during the electron transmission process is always a hidden danger to the overhead transmission lines. In this study, the microstructure evolutions and the strength degradation behaviors of a cold drawn commercially pure Al conductor (CPAC) were investigated systematically by a series of annealing experiments. The results show that the texture evolution, dislocation recovery and subgrain growth during the recrystallization should be responsible for the strength degradation of CPAC. Besides, the microstructure evolution depends on the annealing temperature. For instance, some of the < 111 > texture was changed into the < 001 > one in the CPACs annealed at a temperature of 90 degrees C; while, there is an obvious increase in the subgrain width when the CPACs were annealed in the high temperature range from 150 degrees C to 300 degrees C. Finally, the strength degradation due to the texture evolution and the subgrain coarsening was quantitatively calculated based on the crystallographic analysis.; Strength degradation during the electron transmission process is always a hidden danger to the overhead transmission lines. In this study, the microstructure evolutions and the strength degradation behaviors of a cold drawn commercially pure Al conductor (CPAC) were investigated systematically by a series of annealing experiments. The results show that the texture evolution, dislocation recovery and subgrain growth during the recrystallization should be responsible for the strength degradation of CPAC. Besides, the microstructure evolution depends on the annealing temperature. For instance, some of the < 111 > texture was changed into the < 001 > one in the CPACs annealed at a temperature of 90 degrees C; while, there is an obvious increase in the subgrain width when the CPACs were annealed in the high temperature range from 150 degrees C to 300 degrees C. Finally, the strength degradation due to the texture evolution and the subgrain coarsening was quantitatively calculated based on the crystallographic analysis.
部门归属	[hou, j. p. ; li, x. w.] northeastern univ, minist educ, sch mat sci & engn, dept mat phys & chem, shenyang 110819, liaoning, peoples r china ; [hou, j. p. ; li, x. w.] northeastern univ, minist educ, key lab anisotropy & texture mat, shenyang 110819, liaoning, peoples r china ; [hou, j. p. ; wang, q. ; zhang, z. j. ; zhang, z. f.] chinese acad sci, inst met res, shenyang natl lab mat sci, 72 wenhua rd, shenyang 110016, liaoning, peoples r china ; [chen, q. y. ; yu, h. y. ; li, r.] zhejiang huadian equipment testing inst, natl qual supervis & inspect ctr elect equipment, hangzhou 310015, zhejiang, peoples r china
关键词	CommerciAlly Pure Al Conductor Strength Annealing Treatment Texture Evolution
学科领域	Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
资助者	State Grid Corporation of China [52110416001z]; National Natural Science Foundation of China (NSFC) [51331007]
收录类别	SCI
语种	英语
WOS记录号	WOS:000414108200058
引用统计	被引频次：23[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/78985
专题	中国科学院金属研究所
通讯作者	Wang, Q; Zhang, ZF (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
推荐引用方式 GB/T 7714	Hou, J. P.,Chen, Q. Y.,Wang, Q.,et al. Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor[J]. ELSEVIER SCIENCE SA,2017,707:511-517.
APA	Hou, J. P..,Chen, Q. Y..,Wang, Q..,Yu, H. Y..,Zhang, Z. J..,...&Zhang, ZF .(2017).Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor.ELSEVIER SCIENCE SA,707,511-517.
MLA	Hou, J. P.,et al."Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor".ELSEVIER SCIENCE SA 707(2017):511-517.