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Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor
Hou, J. P.; Chen, Q. Y.; Wang, Q.; Yu, H. Y.; Zhang, Z. J.; Li, R.; Li, X. W.; Zhang, Z. F.; Wang, Q; Zhang, ZF (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
2017-11-07
Source PublicationELSEVIER SCIENCE SA
ISSN0921-5093
Volume707Pages:511-517
AbstractStrength degradation during the electron transmission process is always a hidden danger to the overhead transmission lines. In this study, the microstructure evolutions and the strength degradation behaviors of a cold drawn commercially pure Al conductor (CPAC) were investigated systematically by a series of annealing experiments. The results show that the texture evolution, dislocation recovery and subgrain growth during the recrystallization should be responsible for the strength degradation of CPAC. Besides, the microstructure evolution depends on the annealing temperature. For instance, some of the < 111 > texture was changed into the < 001 > one in the CPACs annealed at a temperature of 90 degrees C; while, there is an obvious increase in the subgrain width when the CPACs were annealed in the high temperature range from 150 degrees C to 300 degrees C. Finally, the strength degradation due to the texture evolution and the subgrain coarsening was quantitatively calculated based on the crystallographic analysis.; Strength degradation during the electron transmission process is always a hidden danger to the overhead transmission lines. In this study, the microstructure evolutions and the strength degradation behaviors of a cold drawn commercially pure Al conductor (CPAC) were investigated systematically by a series of annealing experiments. The results show that the texture evolution, dislocation recovery and subgrain growth during the recrystallization should be responsible for the strength degradation of CPAC. Besides, the microstructure evolution depends on the annealing temperature. For instance, some of the < 111 > texture was changed into the < 001 > one in the CPACs annealed at a temperature of 90 degrees C; while, there is an obvious increase in the subgrain width when the CPACs were annealed in the high temperature range from 150 degrees C to 300 degrees C. Finally, the strength degradation due to the texture evolution and the subgrain coarsening was quantitatively calculated based on the crystallographic analysis.
description.department[hou, j. p. ; li, x. w.] northeastern univ, minist educ, sch mat sci & engn, dept mat phys & chem, shenyang 110819, liaoning, peoples r china ; [hou, j. p. ; li, x. w.] northeastern univ, minist educ, key lab anisotropy & texture mat, shenyang 110819, liaoning, peoples r china ; [hou, j. p. ; wang, q. ; zhang, z. j. ; zhang, z. f.] chinese acad sci, inst met res, shenyang natl lab mat sci, 72 wenhua rd, shenyang 110016, liaoning, peoples r china ; [chen, q. y. ; yu, h. y. ; li, r.] zhejiang huadian equipment testing inst, natl qual supervis & inspect ctr elect equipment, hangzhou 310015, zhejiang, peoples r china
KeywordCommerciAlly Pure Al Conductor Strength Annealing Treatment Texture Evolution
Subject AreaNanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
Funding OrganizationState Grid Corporation of China [52110416001z]; National Natural Science Foundation of China (NSFC) [51331007]
Indexed BySCI
Language英语
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/78985
Collection中国科学院金属研究所
Corresponding AuthorWang, Q; Zhang, ZF (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
Recommended Citation
GB/T 7714
Hou, J. P.,Chen, Q. Y.,Wang, Q.,et al. Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor[J]. ELSEVIER SCIENCE SA,2017,707:511-517.
APA Hou, J. P..,Chen, Q. Y..,Wang, Q..,Yu, H. Y..,Zhang, Z. J..,...&Zhang, ZF .(2017).Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor.ELSEVIER SCIENCE SA,707,511-517.
MLA Hou, J. P.,et al."Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor".ELSEVIER SCIENCE SA 707(2017):511-517.
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