IMR OpenIR
Microstructural Evolution and Service Performance of Cold-drawn Pure Aluminum Conductor Wires
Luo, X. M.; Song, Z. M.; Li, M. L.; Wang, Q.; Zhang, G. P.; Zhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Liaoning, Peoples R China.
2017-09-01
发表期刊JOURNAL MATER SCI TECHNOL
ISSN1005-0302
卷号33期号:9页码:1039-1043
摘要Microstructures and service performance (mechanical and electrical properties) of the commercially pure Al conductor wires subjected to different cold drawing strains were investigated. The results show that the microstructures of the cold-drawn Al wires along the radial direction were inhomogeneous, i.e. the texture in the center region was strong <111> and weak <001> components, while that in the surface region shifted from the initial cubic texture to a <112> component and finally developed into a strong <111> component. The volume fraction of the high angle grain boundaries in the surface region was higher than that in the center region. The cold-drawing process greatly enhanced the yield strength of the pure Al wires while retained the acceptable electrical resistivity. The strengthening mechanism and the variation of electrical conductivity of the cold-drawn Al wires are discussed through correlating with microstructure evolution. (C) 2016 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.; Microstructures and service performance (mechanical and electrical properties) of the commercially pure Al conductor wires subjected to different cold drawing strains were investigated. The results show that the microstructures of the cold-drawn Al wires along the radial direction were inhomogeneous, i.e. the texture in the center region was strong <111> and weak <001> components, while that in the surface region shifted from the initial cubic texture to a <112> component and finally developed into a strong <111> component. The volume fraction of the high angle grain boundaries in the surface region was higher than that in the center region. The cold-drawing process greatly enhanced the yield strength of the pure Al wires while retained the acceptable electrical resistivity. The strengthening mechanism and the variation of electrical conductivity of the cold-drawn Al wires are discussed through correlating with microstructure evolution. (C) 2016 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.
部门归属[luo, x. m. ; song, z. m. ; li, m. l. ; wang, q. ; zhang, g. p.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, liaoning, peoples r china
关键词Cold Drawing Aluminum Microstructure Strength Conductivity
学科领域Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
资助者National Natural Science Foundation of China (NSFC) [51371047, 51571199]
收录类别SCI
语种英语
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/79120
专题中国科学院金属研究所
通讯作者Zhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Liaoning, Peoples R China.
推荐引用方式
GB/T 7714
Luo, X. M.,Song, Z. M.,Li, M. L.,et al. Microstructural Evolution and Service Performance of Cold-drawn Pure Aluminum Conductor Wires[J]. JOURNAL MATER SCI TECHNOL,2017,33(9):1039-1043.
APA Luo, X. M.,Song, Z. M.,Li, M. L.,Wang, Q.,Zhang, G. P.,&Zhang, GP .(2017).Microstructural Evolution and Service Performance of Cold-drawn Pure Aluminum Conductor Wires.JOURNAL MATER SCI TECHNOL,33(9),1039-1043.
MLA Luo, X. M.,et al."Microstructural Evolution and Service Performance of Cold-drawn Pure Aluminum Conductor Wires".JOURNAL MATER SCI TECHNOL 33.9(2017):1039-1043.
条目包含的文件
条目无相关文件。
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Luo, X. M.]的文章
[Song, Z. M.]的文章
[Li, M. L.]的文章
百度学术
百度学术中相似的文章
[Luo, X. M.]的文章
[Song, Z. M.]的文章
[Li, M. L.]的文章
必应学术
必应学术中相似的文章
[Luo, X. M.]的文章
[Song, Z. M.]的文章
[Li, M. L.]的文章
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。