Microstructural Evolution and Service Performance of Cold-drawn Pure Aluminum Conductor Wires

IMR OpenIR

	Microstructural Evolution and Service Performance of Cold-drawn Pure Aluminum Conductor Wires
	Luo, X. M.; Song, Z. M.; Li, M. L.; Wang, Q.; Zhang, G. P.; Zhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Liaoning, Peoples R China.
	2017-09-01
发表期刊	JOURNAL MATER SCI TECHNOL
ISSN	1005-0302
卷号	33 期号:9 页码:1039-1043
摘要	Microstructures and service performance (mechanical and electrical properties) of the commercially pure Al conductor wires subjected to different cold drawing strains were investigated. The results show that the microstructures of the cold-drawn Al wires along the radial direction were inhomogeneous, i.e. the texture in the center region was strong <111> and weak <001> components, while that in the surface region shifted from the initial cubic texture to a <112> component and finally developed into a strong <111> component. The volume fraction of the high angle grain boundaries in the surface region was higher than that in the center region. The cold-drawing process greatly enhanced the yield strength of the pure Al wires while retained the acceptable electrical resistivity. The strengthening mechanism and the variation of electrical conductivity of the cold-drawn Al wires are discussed through correlating with microstructure evolution. (C) 2016 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.; Microstructures and service performance (mechanical and electrical properties) of the commercially pure Al conductor wires subjected to different cold drawing strains were investigated. The results show that the microstructures of the cold-drawn Al wires along the radial direction were inhomogeneous, i.e. the texture in the center region was strong <111> and weak <001> components, while that in the surface region shifted from the initial cubic texture to a <112> component and finally developed into a strong <111> component. The volume fraction of the high angle grain boundaries in the surface region was higher than that in the center region. The cold-drawing process greatly enhanced the yield strength of the pure Al wires while retained the acceptable electrical resistivity. The strengthening mechanism and the variation of electrical conductivity of the cold-drawn Al wires are discussed through correlating with microstructure evolution. (C) 2016 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.
部门归属	[luo, x. m. ; song, z. m. ; li, m. l. ; wang, q. ; zhang, g. p.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, liaoning, peoples r china
关键词	Cold Drawing Aluminum Microstructure Strength Conductivity
学科领域	Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
资助者	National Natural Science Foundation of China (NSFC) [51371047, 51571199]
收录类别	SCI
语种	英语
WOS记录号	WOS:000410668400016
引用统计	被引频次：28[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/79120
专题	中国科学院金属研究所
通讯作者	Zhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Liaoning, Peoples R China.
推荐引用方式 GB/T 7714	Luo, X. M.,Song, Z. M.,Li, M. L.,et al. Microstructural Evolution and Service Performance of Cold-drawn Pure Aluminum Conductor Wires[J]. JOURNAL MATER SCI TECHNOL,2017,33(9):1039-1043.
APA	Luo, X. M.,Song, Z. M.,Li, M. L.,Wang, Q.,Zhang, G. P.,&Zhang, GP .(2017).Microstructural Evolution and Service Performance of Cold-drawn Pure Aluminum Conductor Wires.JOURNAL MATER SCI TECHNOL,33(9),1039-1043.
MLA	Luo, X. M.,et al."Microstructural Evolution and Service Performance of Cold-drawn Pure Aluminum Conductor Wires".JOURNAL MATER SCI TECHNOL 33.9(2017):1039-1043.