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Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates
Luo, X. M.; Zhang, G. P.; Zhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
2017-08-15
发表期刊ELSEVIER SCIENCE SA
ISSN0921-5093
卷号702页码:81-86
摘要Quantitative investigation was performed to understand effects of length scales (film thickness) on grain growth and corresponding fatigue damage behaviors in the nanocrystalline Au thin films on flexible substrates with a film thickness ranging from 930 nm to 20 nm. In thicker films (h >= nm), abnormal grain growth happened due to the local high stress, while in thinner films uniform grain growth occurred. Such length dependent grain growth mechanisms was found to be associated with the film strength and the film thickness. Consequently, the main damages in thicker films exhibited the applied load range-related competition between the intergranular cracks and the intragranular cracks along the localized slip. In the thinner film, fatigue damage is associated with GB-related behaviors, such as intergranular cracking and deformation twinning.; Quantitative investigation was performed to understand effects of length scales (film thickness) on grain growth and corresponding fatigue damage behaviors in the nanocrystalline Au thin films on flexible substrates with a film thickness ranging from 930 nm to 20 nm. In thicker films (h >= nm), abnormal grain growth happened due to the local high stress, while in thinner films uniform grain growth occurred. Such length dependent grain growth mechanisms was found to be associated with the film strength and the film thickness. Consequently, the main damages in thicker films exhibited the applied load range-related competition between the intergranular cracks and the intragranular cracks along the localized slip. In the thinner film, fatigue damage is associated with GB-related behaviors, such as intergranular cracking and deformation twinning.
部门归属[luo, x. m. ; zhang, g. p.] chinese acad sci, inst met res, shenyang natl lab mat sci, 72 wenhua rd, shenyang 110016, liaoning, peoples r china
关键词Grain Growth Thin Film Nanocrystalline Fatigue Damage
学科领域Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
资助者National Natural Science Foundation of China (NSFC) [51601198, 51571199]; Joint Foundation of Liaoning Province National Science Foundation; Shenyang National Laboratory for Materials Science [2015021005]; NSFC [51371180]
收录类别SCI
语种英语
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/79147
专题中国科学院金属研究所
通讯作者Zhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
推荐引用方式
GB/T 7714
Luo, X. M.,Zhang, G. P.,Zhang, GP . Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates[J]. ELSEVIER SCIENCE SA,2017,702:81-86.
APA Luo, X. M.,Zhang, G. P.,&Zhang, GP .(2017).Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates.ELSEVIER SCIENCE SA,702,81-86.
MLA Luo, X. M.,et al."Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates".ELSEVIER SCIENCE SA 702(2017):81-86.
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