Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates

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	Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates
	Luo, X. M.; Zhang, G. P.; Zhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
	2017-08-15
发表期刊	ELSEVIER SCIENCE SA
ISSN	0921-5093
卷号	702 页码:81-86
摘要	Quantitative investigation was performed to understand effects of length scales (film thickness) on grain growth and corresponding fatigue damage behaviors in the nanocrystalline Au thin films on flexible substrates with a film thickness ranging from 930 nm to 20 nm. In thicker films (h >= nm), abnormal grain growth happened due to the local high stress, while in thinner films uniform grain growth occurred. Such length dependent grain growth mechanisms was found to be associated with the film strength and the film thickness. Consequently, the main damages in thicker films exhibited the applied load range-related competition between the intergranular cracks and the intragranular cracks along the localized slip. In the thinner film, fatigue damage is associated with GB-related behaviors, such as intergranular cracking and deformation twinning.; Quantitative investigation was performed to understand effects of length scales (film thickness) on grain growth and corresponding fatigue damage behaviors in the nanocrystalline Au thin films on flexible substrates with a film thickness ranging from 930 nm to 20 nm. In thicker films (h >= nm), abnormal grain growth happened due to the local high stress, while in thinner films uniform grain growth occurred. Such length dependent grain growth mechanisms was found to be associated with the film strength and the film thickness. Consequently, the main damages in thicker films exhibited the applied load range-related competition between the intergranular cracks and the intragranular cracks along the localized slip. In the thinner film, fatigue damage is associated with GB-related behaviors, such as intergranular cracking and deformation twinning.
部门归属	[luo, x. m. ; zhang, g. p.] chinese acad sci, inst met res, shenyang natl lab mat sci, 72 wenhua rd, shenyang 110016, liaoning, peoples r china
关键词	Grain Growth Thin Film Nanocrystalline Fatigue Damage
学科领域	Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
资助者	National Natural Science Foundation of China (NSFC) [51601198, 51571199]; Joint Foundation of Liaoning Province National Science Foundation; Shenyang National Laboratory for Materials Science [2015021005]; NSFC [51371180]
收录类别	SCI
语种	英语
WOS记录号	WOS:000407983500010
引用统计	被引频次：21[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/79147
专题	中国科学院金属研究所
通讯作者	Zhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
推荐引用方式 GB/T 7714	Luo, X. M.,Zhang, G. P.,Zhang, GP . Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates[J]. ELSEVIER SCIENCE SA,2017,702:81-86.
APA	Luo, X. M.,Zhang, G. P.,&Zhang, GP .(2017).Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates.ELSEVIER SCIENCE SA,702,81-86.
MLA	Luo, X. M.,et al."Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates".ELSEVIER SCIENCE SA 702(2017):81-86.