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Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates
Luo, X. M.; Zhang, G. P.; Zhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
2017-08-15
Source PublicationELSEVIER SCIENCE SA
ISSN0921-5093
Volume702Pages:81-86
AbstractQuantitative investigation was performed to understand effects of length scales (film thickness) on grain growth and corresponding fatigue damage behaviors in the nanocrystalline Au thin films on flexible substrates with a film thickness ranging from 930 nm to 20 nm. In thicker films (h >= nm), abnormal grain growth happened due to the local high stress, while in thinner films uniform grain growth occurred. Such length dependent grain growth mechanisms was found to be associated with the film strength and the film thickness. Consequently, the main damages in thicker films exhibited the applied load range-related competition between the intergranular cracks and the intragranular cracks along the localized slip. In the thinner film, fatigue damage is associated with GB-related behaviors, such as intergranular cracking and deformation twinning.; Quantitative investigation was performed to understand effects of length scales (film thickness) on grain growth and corresponding fatigue damage behaviors in the nanocrystalline Au thin films on flexible substrates with a film thickness ranging from 930 nm to 20 nm. In thicker films (h >= nm), abnormal grain growth happened due to the local high stress, while in thinner films uniform grain growth occurred. Such length dependent grain growth mechanisms was found to be associated with the film strength and the film thickness. Consequently, the main damages in thicker films exhibited the applied load range-related competition between the intergranular cracks and the intragranular cracks along the localized slip. In the thinner film, fatigue damage is associated with GB-related behaviors, such as intergranular cracking and deformation twinning.
description.department[luo, x. m. ; zhang, g. p.] chinese acad sci, inst met res, shenyang natl lab mat sci, 72 wenhua rd, shenyang 110016, liaoning, peoples r china
KeywordGrain Growth Thin Film Nanocrystalline Fatigue Damage
Subject AreaNanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
Funding OrganizationNational Natural Science Foundation of China (NSFC) [51601198, 51571199]; Joint Foundation of Liaoning Province National Science Foundation; Shenyang National Laboratory for Materials Science [2015021005]; NSFC [51371180]
Indexed BySCI
Language英语
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/79147
Collection中国科学院金属研究所
Corresponding AuthorZhang, GP (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
Recommended Citation
GB/T 7714
Luo, X. M.,Zhang, G. P.,Zhang, GP . Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates[J]. ELSEVIER SCIENCE SA,2017,702:81-86.
APA Luo, X. M.,Zhang, G. P.,&Zhang, GP .(2017).Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates.ELSEVIER SCIENCE SA,702,81-86.
MLA Luo, X. M.,et al."Grain boundary instability dependent fatigue damage behavior in nanoscale gold films on flexible substrates".ELSEVIER SCIENCE SA 702(2017):81-86.
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