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题名: Fatigue strength plateau induced by microstructure inhomogeneity
作者: Liu, R.;  Tian, Y. Z.;  Zhang, Z. J.;  Zhang, P.;  Zhang, Z. F.
发表日期: 2017-8-15
摘要: Fatigue damage localization is a critical problem which greatly impacts on the fatigue strength improvement. As a main cause of fatigue damage concentration, the microstructure inhomogeneity of cold-rolled and annealed Cu-5at%Al alloy has been paid much attention in this study. A notable plateau with constant fatigue strength is discovered in the region of partially recrystallized microstructures which share similar maximum grain size. The existence of such "fatigue strength plateau" suggests that in some specific cases, fatigue strength would vary with neither the tensile strength nor the average grain size, since the fatigue resistance of the damage localized regions remains unchanged.
Appears in Collections:中国科学院金属研究所_期刊论文

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Recommended Citation:
Liu, R.,Tian, Y. Z.,Zhang, Z. J.,et al. Fatigue Strength Plateau Induced By Microstructure Inhomogeneity[J]. Elsevier Science Sa,2017,702:259-264.

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