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A FinFET with one atomic layer channel
Mao-Lin Chen; Xingdan Sun; Hang Liu; Hanwen Wang; Qianbing Zhu; Shasha Wang; Haifeng Du; Baojuan Dong; Jing Zhang; Yun Sun; Song Qiu; Thomas Alava; Song Liu; Dong-Ming Sun; Zheng Han
2020
发表期刊naturecommunications
ISSN2041-1723
卷号11期号:1页码:1-7
摘要Since its invention in the 1960s, one of the most significant evolutions of metal-oxide-semiconductor field effect transistors (MOS-FETs) would be the three dimensionalized version that makes the semiconducting channel vertically wrapped by conformal gate electrodes, also recognized as FinFET. During the past decades, the width of fin ( W fin \documentclass12pt{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${}_{{\rm{fin}}}$$\end{document} ) in FinFETs has shrunk from about 150 nm to a few nanometers. However, W fin \documentclass12pt{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${}_{{\rm{fin}}}$$\end{document} seems to have been levelling off in recent years, owing to the limitation of lithography precision. Here, we show that by adapting a template-growth method, different types of mono-layered two-dimensional crystals are isolated in a vertical manner. Based on this, FinFETs with one atomic layer fin are obtained, with on ~ 1 0 7 \documentclass12pt{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\sim\!\! 10^{7}$$\end{document} . Our findings push the FinFET to the sub 1 nm fin-width limit, and may shed light on the next generation nanoelectronics for higher integration and lower power consumption.
DOI10.1038/s41467-020-15096-0
语种英语
WOS记录号WOS:000543997700011
引用统计
被引频次:118[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/80697
专题中国科学院金属研究所
作者单位1.Institute of Metal Research, Chinese Academy of Sciences
2.University of Science and Technology of China
3.Hunan University
4.High Magnetic Field Laboratory and University of Science and Technology of China, Chinese Academy of Science (CAS)
5.Shanxi University
6.Shanxi University
7.Suzhou Institute of Nanotech and Nanobionics, Chinese Academy of Science
8.Université Grenoble Alpes, CEA, LETI
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GB/T 7714
Mao-Lin Chen,Xingdan Sun,Hang Liu,et al. A FinFET with one atomic layer channel[J]. naturecommunications,2020,11(1):1-7.
APA Mao-Lin Chen.,Xingdan Sun.,Hang Liu.,Hanwen Wang.,Qianbing Zhu.,...&Zheng Han.(2020).A FinFET with one atomic layer channel.naturecommunications,11(1),1-7.
MLA Mao-Lin Chen,et al."A FinFET with one atomic layer channel".naturecommunications 11.1(2020):1-7.
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