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Influences of doping Ti nanoparticles on microstructure and properties of Sn58Bi solder
Jiang, Nan; Zhang, Liang; Liu, Zhi-quan; Sun, Lei; Xiong, Ming-yue; Zhao, Meng; Xu, Kai-kai
2019-10-01
Source PublicationJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
ISSN0957-4522
Volume30Issue:19Pages:17583-17590
AbstractIn this paper, the influences of adding Titanium (Ti) nanoparticles on melting characteristics, wettability, shear properties and the growth of interfacial intermetallic compounds (IMC) of Sn58Bi solder were investigated. The results show that the addition of Ti nanoparticles improved the wettability and shear strength of Sn58Bi solder, and the optimum additive content was 0.1 wt%. The microstructure of the Sn58Bi solder was refined obviously with the addition of Ti nanoparticles. The thickness of interfacial IMC reduced significantly by adding Ti nanoparticles. However, doping Ti nanoparticles had the slight effect on the melting temperature of Sn58Bi solder. Moreover, the thickness of IMC at the Sn58Bi/Cu interface was distinctly larger than that of Sn58Bi-0.1Ti/Cu solder after multiple reflows, which means that the addition of Ti nanoparticles could suppress the growth of IMC at solder/Cu interface during multiple reflows.
Indexed BySCI
Language英语
WOS IDWOS:000490120000006
PublisherSPRINGER
Citation statistics
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/80723
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
Jiang, Nan,Zhang, Liang,Liu, Zhi-quan,et al. Influences of doping Ti nanoparticles on microstructure and properties of Sn58Bi solder[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2019,30(19):17583-17590.
APA Jiang, Nan.,Zhang, Liang.,Liu, Zhi-quan.,Sun, Lei.,Xiong, Ming-yue.,...&Xu, Kai-kai.(2019).Influences of doping Ti nanoparticles on microstructure and properties of Sn58Bi solder.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,30(19),17583-17590.
MLA Jiang, Nan,et al."Influences of doping Ti nanoparticles on microstructure and properties of Sn58Bi solder".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 30.19(2019):17583-17590.
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