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Solid-State Dewetting in Polycrystalline Co Films on Native Oxide Si(100) by Kirkendall Effects
Zhao, Yue; Wang, Kai; Yuan, Shuang; Li, Guojian; Ma, Yonghui; Wang, Qang
2019-08-15
Source PublicationJOURNAL OF PHYSICAL CHEMISTRY C
ISSN1932-7447
Volume123Issue:32Pages:19572-19578
AbstractThe polycrystalline Co films with a thickness of 120 nm were deposited on the native oxide Si(100) substrate.
Indexed BySCI
Language英语
WOS IDWOS:000481568900035
PublisherAMER CHEMICAL SOC
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/80828
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
Zhao, Yue,Wang, Kai,Yuan, Shuang,et al. Solid-State Dewetting in Polycrystalline Co Films on Native Oxide Si(100) by Kirkendall Effects[J]. JOURNAL OF PHYSICAL CHEMISTRY C,2019,123(32):19572-19578.
APA Zhao, Yue,Wang, Kai,Yuan, Shuang,Li, Guojian,Ma, Yonghui,&Wang, Qang.(2019).Solid-State Dewetting in Polycrystalline Co Films on Native Oxide Si(100) by Kirkendall Effects.JOURNAL OF PHYSICAL CHEMISTRY C,123(32),19572-19578.
MLA Zhao, Yue,et al."Solid-State Dewetting in Polycrystalline Co Films on Native Oxide Si(100) by Kirkendall Effects".JOURNAL OF PHYSICAL CHEMISTRY C 123.32(2019):19572-19578.
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