| Microstructure and PTCR effect of La-doped BaPbO3 ceramics | |
| Li, ZC; Zhang, H; Bergman, B | |
| Corresponding Author | Li, ZC(li@mse.kth.se) |
| 2004-03-01 | |
| Source Publication | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
 |
| ISSN | 0957-4522 |
| Volume | 15Issue:3Pages:183-186 |
| Abstract | La-doped BaPbO3 ceramics were prepared by using BaCO3 and PbO. Electrical properties and microstructure of the ceramics were studied. The results show a thin surface layer with a very low resistivity, and the interior of the ceramics with the characteristics of positive temperature coefficient of resistivity (PTCR). The PTCR behavior was related to the La content. The investigation by scanning electron microscopy and transmission electron microscopy revealed that the low resistivity of the surface layer was due to formation of a nano-size BaPbO3 phase with metallic properties. (C) 2004 Kluwer Academic Publishers. |
| Indexed By | SCI |
| Language | 英语 |
| WOS Research Area | Engineering ; Materials Science ; Physics |
| WOS Subject | Engineering, Electrical & Electronic ; Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter |
| WOS ID | WOS:000187939000010 |
| Publisher | KLUWER ACADEMIC PUBL |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/81397 |
| Corresponding Author | Li, ZC |
| Affiliation | 1.Royal Inst Technol, Dept Mat Sci & Engn, Div Ceram, S-10044 Stockholm, Sweden 2.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China |
| Recommended Citation GB/T 7714 | Li, ZC,Zhang, H,Bergman, B. Microstructure and PTCR effect of La-doped BaPbO3 ceramics[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2004,15(3):183-186. |
| APA | Li, ZC,Zhang, H,&Bergman, B.(2004).Microstructure and PTCR effect of La-doped BaPbO3 ceramics.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,15(3),183-186. |
| MLA | Li, ZC,et al."Microstructure and PTCR effect of La-doped BaPbO3 ceramics".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 15.3(2004):183-186. |
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