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力电热多场耦合作用下微电子产品可靠性测试平台
崔学顺; 郭敬东; 祝清省; 刘志权; 吴迪; 张磊; 曹丽华
2017-06-23
Rights Holder中国科学院金属研究所
Subtype发明专利
Patent Number201210563644.2
Document Type专利
Identifierhttp://ir.imr.ac.cn/handle/321006/81788
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
崔学顺,郭敬东,祝清省,等. 力电热多场耦合作用下微电子产品可靠性测试平台. 201210563644.2[P]. 2017-06-23.
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