IMR OpenIR
剥离涂层下缝隙内电位二维分布测量装置
许进; 孙成; 于长坤; 吴堂清; 闫茂成; 龙康
2017-08-11
Rights Holder中国科学院金属研究所
Subtype发明专利
Patent Number201310152359.6
Document Type专利
Identifierhttp://ir.imr.ac.cn/handle/321006/81793
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
许进,孙成,于长坤,等. 剥离涂层下缝隙内电位二维分布测量装置. 201310152359.6[P]. 2017-08-11.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[许进]'s Articles
[孙成]'s Articles
[于长坤]'s Articles
Baidu academic
Similar articles in Baidu academic
[许进]'s Articles
[孙成]'s Articles
[于长坤]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[许进]'s Articles
[孙成]'s Articles
[于长坤]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.