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一种广泛适用于微型样品的单剪切性能测试装置
李阁平; 袁福森; 储林华; 罗倩倩; 王练; 高博; 李晓珊; 顾恒飞; 刘承泽; 韩福洲
2017-12-22
Rights Holder中国科学院金属研究所
Subtype实用新型
Patent Number201720296551.6
Document Type专利
Identifierhttp://ir.imr.ac.cn/handle/321006/81857
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
李阁平,袁福森,储林华,等. 一种广泛适用于微型样品的单剪切性能测试装置. 201720296551.6[P]. 2017-12-22.
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