IMR OpenIR
Size effect of nano-copper films on complex optical constant and permittivity in frared region
Du, H; Lee, SW; Gong, J; Sun, C; Wen, LS
通讯作者Du, H(hdu72@hotmail.com)
2004-02-01
发表期刊MATERIALS LETTERS
ISSN0167-577X
卷号58期号:6页码:1117-1120
摘要Nano-copper films were prepared by DC magnetron sputtering. Their reflectivity and transmittivity to electromagnetic wave in infrared region were measured with Fourier Transformation Infrared Spectrometer (FTIR), by which their complex optical constant and permittivity were obtained. The results show that the complex optical constant and pen-nittivity of nano-copper films depend upon the film thickness. This dependence is correlated with microstructure transition during the film growth. (C) 2003 Elsevier B.V. All rights reserved.
关键词magnetron sputtering nano-copper film complex optical constant complex permittivity size effect
DOI10.1016/j.matlet.2003.09.002
收录类别SCI
语种英语
WOS研究方向Materials Science ; Physics
WOS类目Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号WOS:000188288600056
出版者ELSEVIER SCIENCE BV
引用统计
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/81866
通讯作者Du, H
作者单位1.Sun Moon Univ, Dept Mat Sci, Asan 336708, ChungNam, South Korea
2.Acad Sinica, Inst Met Res, Shenyang 110016, Peoples R China
推荐引用方式
GB/T 7714
Du, H,Lee, SW,Gong, J,et al. Size effect of nano-copper films on complex optical constant and permittivity in frared region[J]. MATERIALS LETTERS,2004,58(6):1117-1120.
APA Du, H,Lee, SW,Gong, J,Sun, C,&Wen, LS.(2004).Size effect of nano-copper films on complex optical constant and permittivity in frared region.MATERIALS LETTERS,58(6),1117-1120.
MLA Du, H,et al."Size effect of nano-copper films on complex optical constant and permittivity in frared region".MATERIALS LETTERS 58.6(2004):1117-1120.
条目包含的文件
条目无相关文件。
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Du, H]的文章
[Lee, SW]的文章
[Gong, J]的文章
百度学术
百度学术中相似的文章
[Du, H]的文章
[Lee, SW]的文章
[Gong, J]的文章
必应学术
必应学术中相似的文章
[Du, H]的文章
[Lee, SW]的文章
[Gong, J]的文章
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。