IMR OpenIR
一种透射电子显微镜用原位电学样品杆系统
邰凯平; 王忠良
2018-08-17
Rights Holder中国科学院金属研究所
Subtype实用新型
Patent Number201820024768.6
Document Type专利
Identifierhttp://ir.imr.ac.cn/handle/321006/81969
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
邰凯平,王忠良. 一种透射电子显微镜用原位电学样品杆系统. 201820024768.6[P]. 2018-08-17.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[邰凯平]'s Articles
[王忠良]'s Articles
Baidu academic
Similar articles in Baidu academic
[邰凯平]'s Articles
[王忠良]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[邰凯平]'s Articles
[王忠良]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.