精确测定材料中偏聚第二相分布均匀性的方法

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	精确测定材料中偏聚第二相分布均匀性的方法
	李阁平; 张利峰; 李明远; 王练; 彭胜; 吴松全; 高博; 顾恒飞; 庞丽侠
	2018-09-04
Rights Holder	中国科学院金属研究所
Subtype	发明专利
Patent Number	201410428916.7
Document Type	专利
Identifier	http://ir.imr.ac.cn/handle/321006/81985
Collection	中国科学院金属研究所
Recommended Citation GB/T 7714	李阁平,张利峰,李明远,等. 精确测定材料中偏聚第二相分布均匀性的方法. 201410428916.7[P]. 2018-09-04.

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