IMR OpenIR
电感耦合等离子体发射光谱法检测铸造Al-Si-Cu系合金中硅铜镧铈钪
王丹; 王春浩; 李辉
2020-04-15
Source Publication天津冶金
Issue02Pages:61-63+73
Abstract采用两种比例的盐酸、硝酸、氢氟酸溶解样品,采用基体匹配法配制标准溶液系列以消除基体的影响,采用轴向观测方式提高了稀土元素的灵敏度,选择Si 185.005 nm、Cu 327.395 nm、La 408.671 nm、Ce 399.924nm、Sc361.383 nm为分析线,使用电感耦合等离子体发射光谱法(ICP-OES)测定铸造Al-Si-Cu系合金中的硅铜镧铈钪。Si的质量分数在0.10%~15%范围内,Cu的质量分数在0.05%~8.0%范围内,La、Ce、Sc的质量分数在0.0005%~0.50%范围内,各元素质量分数与发射强度呈线性,相关系数>0.9997;检出限范围是0.00001%~0.0036%;测定结果的相对标准偏差<2.0%;加标回收率为92.5%~103.0%。方法简单、快速,测试结果令人满意。
Keyword电感耦合等离子体发射光谱法(ICP-OES) 铸造Al-Si-Cu系合金 稀土元素
MOST Discipline CatalogueO657.31 ; TG146.21
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/82082
Collection中国科学院金属研究所
Affiliation中国科学院金属研究所
First Author AffilicationInstitute of Metal Research Chinese Academy of Sciences
Recommended Citation
GB/T 7714
王丹,王春浩,李辉. 电感耦合等离子体发射光谱法检测铸造Al-Si-Cu系合金中硅铜镧铈钪[J]. 天津冶金,2020(02):61-63+73.
APA 王丹,王春浩,&李辉.(2020).电感耦合等离子体发射光谱法检测铸造Al-Si-Cu系合金中硅铜镧铈钪.天津冶金(02),61-63+73.
MLA 王丹,et al."电感耦合等离子体发射光谱法检测铸造Al-Si-Cu系合金中硅铜镧铈钪".天津冶金 .02(2020):61-63+73.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[王丹]'s Articles
[王春浩]'s Articles
[李辉]'s Articles
Baidu academic
Similar articles in Baidu academic
[王丹]'s Articles
[王春浩]'s Articles
[李辉]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[王丹]'s Articles
[王春浩]'s Articles
[李辉]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.