| Ultrahigh strength and high electrical conductivity in copper |
| Lu, L; Shen, YF; Chen, XH; Qian, LH; Lu, K
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| 通讯作者 | Lu, K()
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| 2004-04-16
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| 发表期刊 | SCIENCE
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| ISSN | 0036-8075
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| 卷号 | 304期号:5669页码:422-426 |
| 摘要 | Methods used to strengthen metals generally also cause a pronounced decrease in electrical conductivity, so that a tradeoff must be made between conductivity and mechanical strength. We synthesized pure copper samples with a high density of nanoscale growth twins. They showed a tensile strength about 10 times higher than that of conventional coarse-grained copper, while retaining an electrical conductivity comparable to that of pure copper. The ultrahigh strength originates from the effective blockage of dislocation motion by numerous coherent twin boundaries that possess an extremely low electrical resistivity, which is not the case for other types of grain boundaries. |
| 收录类别 | SCI
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| 语种 | 英语
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| WOS研究方向 | Science & Technology - Other Topics
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| WOS类目 | Multidisciplinary Sciences
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| WOS记录号 | WOS:000220845400043
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| 出版者 | AMER ASSOC ADVANCEMENT SCIENCE
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| 引用统计 |
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| 文献类型 | 期刊论文
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| 条目标识符 | http://ir.imr.ac.cn/handle/321006/82346
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| 通讯作者 | Lu, K |
| 作者单位 | Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
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推荐引用方式
GB/T 7714 |
Lu, L,Shen, YF,Chen, XH,et al. Ultrahigh strength and high electrical conductivity in copper[J]. SCIENCE,2004,304(5669):422-426.
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| APA |
Lu, L,Shen, YF,Chen, XH,Qian, LH,&Lu, K.(2004).Ultrahigh strength and high electrical conductivity in copper.SCIENCE,304(5669),422-426.
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| MLA |
Lu, L,et al."Ultrahigh strength and high electrical conductivity in copper".SCIENCE 304.5669(2004):422-426.
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