Ultrahigh strength and high electrical conductivity in copper | |
Lu, L; Shen, YF; Chen, XH; Qian, LH; Lu, K | |
Corresponding Author | Lu, K() |
2004-04-16 | |
Source Publication | SCIENCE
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ISSN | 0036-8075 |
Volume | 304Issue:5669Pages:422-426 |
Abstract | Methods used to strengthen metals generally also cause a pronounced decrease in electrical conductivity, so that a tradeoff must be made between conductivity and mechanical strength. We synthesized pure copper samples with a high density of nanoscale growth twins. They showed a tensile strength about 10 times higher than that of conventional coarse-grained copper, while retaining an electrical conductivity comparable to that of pure copper. The ultrahigh strength originates from the effective blockage of dislocation motion by numerous coherent twin boundaries that possess an extremely low electrical resistivity, which is not the case for other types of grain boundaries. |
Indexed By | SCI |
Language | 英语 |
WOS Research Area | Science & Technology - Other Topics |
WOS Subject | Multidisciplinary Sciences |
WOS ID | WOS:000220845400043 |
Publisher | AMER ASSOC ADVANCEMENT SCIENCE |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.imr.ac.cn/handle/321006/82346 |
Corresponding Author | Lu, K |
Affiliation | Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China |
Recommended Citation GB/T 7714 | Lu, L,Shen, YF,Chen, XH,et al. Ultrahigh strength and high electrical conductivity in copper[J]. SCIENCE,2004,304(5669):422-426. |
APA | Lu, L,Shen, YF,Chen, XH,Qian, LH,&Lu, K.(2004).Ultrahigh strength and high electrical conductivity in copper.SCIENCE,304(5669),422-426. |
MLA | Lu, L,et al."Ultrahigh strength and high electrical conductivity in copper".SCIENCE 304.5669(2004):422-426. |
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