Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram

doi:10.1016/j.micron.2005.05.007

IMR OpenIR

	Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram
	Du, K ; Wang, YM ; Lichte, H ; Ye, HQ
通讯作者	Du, K(kxd44@cwru.edu)
	2006
发表期刊	MICRON
ISSN	0968-4328
卷号	37 期号:1 页码:67-72
摘要	Precise knowledge of crystal thickness and orientation is critical for reliable interpretation of high-resolution transmission electron micrographs. In this paper, we propose a criterion of S-2(T, u, v), which measures the crystal thickness by intensity matching of the selected-area Fourier transform of experimental holograms with the calculated electron diffraction pattern at a series of trial thicknesses (T) and crystal tilts (it, v). This criterion has been demonstrated successfully for local thickness determination from a simulated high-resolution image of a wedge-shaped YBa2Cu3O7-delta and from an experimental hologram of a Si crystal. (c) 2005 Published by Elsevier Ltd.
关键词	electron holography high-resolution transmission electron microscopy quantitative electron microscopy
DOI	10.1016/j.micron.2005.05.007
收录类别	SCI
语种	英语
WOS研究方向	Microscopy
WOS类目	Microscopy
WOS记录号	WOS:000234032700008
出版者	PERGAMON-ELSEVIER SCIENCE LTD
引用统计	被引频次：1[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/87701
专题	中国科学院金属研究所
通讯作者	Du, K
作者单位	1.Case Western Reserve Univ, Dept Mat Sci & Engn, Cleveland, OH 44106 USA 2.Chinese Acad Sci, Met Res Inst, Shenyang 110016, Peoples R China 3.Dresden Univ Technol, Inst Appl Phys, D-01062 Dresden, Germany
推荐引用方式 GB/T 7714	Du, K,Wang, YM,Lichte, H,et al. Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram[J]. MICRON,2006,37(1):67-72.
APA	Du, K,Wang, YM,Lichte, H,&Ye, HQ.(2006).Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram.MICRON,37(1),67-72.
MLA	Du, K,et al."Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram".MICRON 37.1(2006):67-72.