Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0(1)over-bar10] orientation

IMR OpenIR

	Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0(1)over-bar10] orientation
	Du, K.1,2; Ruehle, M.2
通讯作者	Du, K.(kuidu@imr.ac.cn)
	2008-10-01
发表期刊	JOURNAL OF MICROSCOPY
ISSN	0022-2720
卷号	232 期号:1 页码:137-144
摘要	The effects of imaging parameters have been studied on their roles of the severe mismatches between experimental and simulated high-resolution transmission electron micrographs of sapphire along the [0 (1) over bar 10] direction. Image simulation and convergent-beam electron diffraction techniques have been performed on misalignments of the electron beam and the crystal specimen. Based on this study, we have introduced an approach to achieve reliable simulation for experimental images of sapphire on the [0 (1) over bar 10] projection by the use of iterative digital image matching.
关键词	high-resolution transmission electron microscopy image simulation quantitative electron microscopy sapphire
资助者	Natural Sciences Foundation of China
收录类别	SCI
语种	英语
资助项目	Natural Sciences Foundation of China[50601027]
WOS研究方向	Microscopy
WOS类目	Microscopy
WOS记录号	WOS:000259525300016
出版者	WILEY-BLACKWELL
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/93675
专题	中国科学院金属研究所
通讯作者	Du, K.
作者单位	1.Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China 2.Max Planck Inst Met Res, D-70569 Stuttgart, Germany
推荐引用方式 GB/T 7714	Du, K.,Ruehle, M.. Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0(1)over-bar10] orientation[J]. JOURNAL OF MICROSCOPY,2008,232(1):137-144.
APA	Du, K.,&Ruehle, M..(2008).Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0(1)over-bar10] orientation.JOURNAL OF MICROSCOPY,232(1),137-144.
MLA	Du, K.,et al."Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0(1)over-bar10] orientation".JOURNAL OF MICROSCOPY 232.1(2008):137-144.