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Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film
Zhang, M.1,2; Ma, X. L.2; Li, D. X.2; Xie, S. J.1,3; Chang, R. P. H.1,3
Corresponding AuthorZhang, M.(ming-zhang@northwestern.edu)
2008-12-20
Source PublicationMATERIALS CHEMISTRY AND PHYSICS
ISSN0254-0584
Volume112Issue:3Pages:756-761
AbstractPerovskite-based BaNb0.2Ti0.8O3 (BNTO) thin film, grown by computer-controlled laser molecular beam epitaxy on SrTiO3 (001) substrate, was investigated by means of high-resolution electron microscopic (HREM) imaging, high-angle annular dark-field (HAADF) imaging, and X-ray energy dispersive spectrometric (XEDS) line-scanning in a transmission electron microscope. The microstructure of the BaNb0.2Ti0.8O3 film is clarified in terms of various domains due to tetragonal characteristics. Compositional fluctuation was observed in the various domains and domain boundaries. The misfit strain and element diffusivity during the film growth together with inherent tetragonal characteristics are discussed as a possible mechanism for the formation and distribution of various domains. (C) 2008 Elsevier B.V. All rights reserved.
KeywordMicrostructure characterization Transmission electron microscopy Interface structure Defects Orientation relationship Perovskite thin films
Funding OrganizationNational Outstanding Young Scientist Foundation ; Special Funds for the Major State Basic Research Projects of China
DOI10.1016/j.matchemphys.2008.06.033
Indexed BySCI
Language英语
Funding ProjectNational Outstanding Young Scientist Foundation[50325101] ; Special Funds for the Major State Basic Research Projects of China[2002CB613503]
WOS Research AreaMaterials Science
WOS SubjectMaterials Science, Multidisciplinary
WOS IDWOS:000262183900011
PublisherELSEVIER SCIENCE SA
Citation statistics
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/95399
Collection中国科学院金属研究所
Corresponding AuthorZhang, M.
Affiliation1.Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
2.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
3.Northwestern Univ, Inst Mat Res, Evanston, IL 60208 USA
Recommended Citation
GB/T 7714
Zhang, M.,Ma, X. L.,Li, D. X.,et al. Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film[J]. MATERIALS CHEMISTRY AND PHYSICS,2008,112(3):756-761.
APA Zhang, M.,Ma, X. L.,Li, D. X.,Xie, S. J.,&Chang, R. P. H..(2008).Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film.MATERIALS CHEMISTRY AND PHYSICS,112(3),756-761.
MLA Zhang, M.,et al."Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film".MATERIALS CHEMISTRY AND PHYSICS 112.3(2008):756-761.
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