| Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers | |
| Feigl, L.1; Zheng, S. J.2; Birajdar, B. I.1; Rodriguez, B. J.1; Zhu, Y. L.1,2; Alexe, M.1; Hesse, D.1 | |
| 通讯作者 | Feigl, L.(lfeigl@mpi-halle.de) |
| 2009-04-21 | |
| 发表期刊 | JOURNAL OF PHYSICS D-APPLIED PHYSICS
 |
| ISSN | 0022-3727 |
| 卷号 | 42期号:8页码:6 |
| 摘要 | Multilayers consisting of two tetragonal compositions PbZr0.2Ti0.8O3 and PbZr0.4Ti0.6O3 were deposited onto a SrRuO3 electrode grown on a vicinal (100) SrTiO3 substrate. It has been shown by extensive structural investigations comprising transmission electron microscopy in conventional and high resolution mode, reciprocal space mapping and piezoresponse force microscopy that with decreasing layer thickness a transition from a-domains confined to individual layers to a-domains propagating through the whole film takes place. This is caused by the formation of a common strain state of all layers which is responsible for the observed enhancement of the electrical properties. These show a maximum in the product of remanent polarization and dielectric constant at a certain density of interfaces. If the interface density becomes too high the lattice distortion accompanying each interface deteriorates the properties of the multilayer structure. |
| DOI | 10.1088/0022-3727/42/8/085305 |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS研究方向 | Physics |
| WOS类目 | Physics, Applied |
| WOS记录号 | WOS:000265248300059 |
| 出版者 | IOP PUBLISHING LTD |
| 引用统计 | |
| 文献类型 | 期刊论文 |
| 条目标识符 | http://ir.imr.ac.cn/handle/321006/96317 |
| 专题 | 中国科学院金属研究所 |
| 通讯作者 | Feigl, L. |
| 作者单位 | 1.Max Planck Inst Microstruct Phys, D-06120 Halle, Germany 2.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China |
| 推荐引用方式 GB/T 7714 | Feigl, L.,Zheng, S. J.,Birajdar, B. I.,et al. Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2009,42(8):6. |
| APA | Feigl, L..,Zheng, S. J..,Birajdar, B. I..,Rodriguez, B. J..,Zhu, Y. L..,...&Hesse, D..(2009).Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers.JOURNAL OF PHYSICS D-APPLIED PHYSICS,42(8),6. |
| MLA | Feigl, L.,et al."Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers".JOURNAL OF PHYSICS D-APPLIED PHYSICS 42.8(2009):6. |
| 条目包含的文件 | 条目无相关文件。 | |||||
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