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Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers
Feigl, L.1; Zheng, S. J.2; Birajdar, B. I.1; Rodriguez, B. J.1; Zhu, Y. L.1,2; Alexe, M.1; Hesse, D.1
Corresponding AuthorFeigl, L.(lfeigl@mpi-halle.de)
2009-04-21
Source PublicationJOURNAL OF PHYSICS D-APPLIED PHYSICS
ISSN0022-3727
Volume42Issue:8Pages:6
AbstractMultilayers consisting of two tetragonal compositions PbZr0.2Ti0.8O3 and PbZr0.4Ti0.6O3 were deposited onto a SrRuO3 electrode grown on a vicinal (100) SrTiO3 substrate. It has been shown by extensive structural investigations comprising transmission electron microscopy in conventional and high resolution mode, reciprocal space mapping and piezoresponse force microscopy that with decreasing layer thickness a transition from a-domains confined to individual layers to a-domains propagating through the whole film takes place. This is caused by the formation of a common strain state of all layers which is responsible for the observed enhancement of the electrical properties. These show a maximum in the product of remanent polarization and dielectric constant at a certain density of interfaces. If the interface density becomes too high the lattice distortion accompanying each interface deteriorates the properties of the multilayer structure.
DOI10.1088/0022-3727/42/8/085305
Indexed BySCI
Language英语
WOS Research AreaPhysics
WOS SubjectPhysics, Applied
WOS IDWOS:000265248300059
PublisherIOP PUBLISHING LTD
Citation statistics
Cited Times:11[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/96317
Collection中国科学院金属研究所
Corresponding AuthorFeigl, L.
Affiliation1.Max Planck Inst Microstruct Phys, D-06120 Halle, Germany
2.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Recommended Citation
GB/T 7714
Feigl, L.,Zheng, S. J.,Birajdar, B. I.,et al. Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2009,42(8):6.
APA Feigl, L..,Zheng, S. J..,Birajdar, B. I..,Rodriguez, B. J..,Zhu, Y. L..,...&Hesse, D..(2009).Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers.JOURNAL OF PHYSICS D-APPLIED PHYSICS,42(8),6.
MLA Feigl, L.,et al."Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers".JOURNAL OF PHYSICS D-APPLIED PHYSICS 42.8(2009):6.
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