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Dynamic hysteresis scaling of ferroelectric Pb0.9Ba0.1(Zr0.52Ti0.48)O-3 thin films
Guo, Y. Y.1; Wei, T.1; He, Q. Y.2; Liu, J-M1,2,3
Corresponding AuthorLiu, J-M(liujm@nju.edu.cn)
2009-12-02
Source PublicationJOURNAL OF PHYSICS-CONDENSED MATTER
ISSN0953-8984
Volume21Issue:48Pages:8
AbstractWe measure systematically the intrinsic scaling behavior of dynamic hysteresis for Pb0.9Ba0.1(Zr0.52Ti0.48)O-3 (PBZT) ferroelectric thin films with Pt electrodes on Si substrates, utilizing the Sawyer-Tower technique. For the as-prepared thin films of similar thickness and microstructure, over the low frequency range, the scaling follows the power law < A > proportional to f(0.28)E(0)(0.91) under low E-0 and the power law < A > proportional to f(0.35)E(0)(0.78) under high E-0, where < A > is the hysteresis area, and f and E-0 are the frequency and amplitude of the external electric field. In the high-f range, the power law for low E0 takes the form of < A > proportional to f(-0.32)E(0)(3.2), while that for high E-0 takes the form of < A > proportional to f(-0.2)E(0)(2.2). It is identified that the dynamic behaviors at low frequency mainly come from the intrinsic domain reversal instead of others like the leakage current, while the depolarization field may influence the frequency exponents at high frequency. We study the temperature scaling of the hysteresis, indicating that the scaling under low E-0 is roughly consistent with the (Phi(2))(2) model. Finally, we argue that experimentally obtained power law scaling for Pb(Zr0.52Ti0.48)O-3 thin films prepared under the given conditions may not be reliable due to the polarization fatigue effect.
Funding OrganizationNational Natural Science Foundation of China ; National Key Projects for Basic Researches of China
DOI10.1088/0953-8984/21/48/485901
Indexed BySCI
Language英语
Funding ProjectNational Natural Science Foundation of China[50832002] ; National Natural Science Foundation of China[10674061] ; National Natural Science Foundation of China[50572038] ; National Key Projects for Basic Researches of China[2009CB623303]
WOS Research AreaPhysics
WOS SubjectPhysics, Condensed Matter
WOS IDWOS:000271662800025
PublisherIOP PUBLISHING LTD
Citation statistics
Cited Times:27[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/98687
Collection中国科学院金属研究所
Corresponding AuthorLiu, J-M
Affiliation1.Nanjing Univ, Solid State Microstruct Lab, Nanjing 210093, Peoples R China
2.S China Normal Univ, Sch Phys, Guangzhou 510006, Guangdong, Peoples R China
3.Chinese Acad Sci, Int Ctr Mat Phys, Shenyang, Peoples R China
Recommended Citation
GB/T 7714
Guo, Y. Y.,Wei, T.,He, Q. Y.,et al. Dynamic hysteresis scaling of ferroelectric Pb0.9Ba0.1(Zr0.52Ti0.48)O-3 thin films[J]. JOURNAL OF PHYSICS-CONDENSED MATTER,2009,21(48):8.
APA Guo, Y. Y.,Wei, T.,He, Q. Y.,&Liu, J-M.(2009).Dynamic hysteresis scaling of ferroelectric Pb0.9Ba0.1(Zr0.52Ti0.48)O-3 thin films.JOURNAL OF PHYSICS-CONDENSED MATTER,21(48),8.
MLA Guo, Y. Y.,et al."Dynamic hysteresis scaling of ferroelectric Pb0.9Ba0.1(Zr0.52Ti0.48)O-3 thin films".JOURNAL OF PHYSICS-CONDENSED MATTER 21.48(2009):8.
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