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Single-shot three-dimensional reconstruction based on structured light line pattern 期刊论文
OPTICS AND LASERS IN ENGINEERING, 2018, 卷号: 106, 页码: 10-16
作者:  Wang, ZhenZhou;  Yang, YongMing
收藏  |  浏览/下载：99/0  |  提交时间：2021/02/02
One-shot reconstruction  Structured light  Image processing  Clustering  
Single-shot three-dimensional reconstruction based on structured light line pattern 期刊论文
OPTICS AND LASERS IN ENGINEERING, 2018, 卷号: 106, 页码: 10-16
作者:  Wang, ZhenZhou;  Yang, YongMing
收藏  |  浏览/下载：99/0  |  提交时间：2021/02/02
One-shot reconstruction  Structured light  Image processing  Clustering  
DESIGN AND TESTING OF AN ON-LINE OMNIDIRECTIONAL INSPECTION AND SORTING SYSTEM FOR SOYBEAN SEEDS 期刊论文
APPLIED ENGINEERING IN AGRICULTURE, 2018, 卷号: 34, 期号: 6, 页码: 1003-1016
作者:  Quan, L.;  Zhang, T.;  Sun, L.;  Chen, X.;  Xu, Z.
收藏  |  浏览/下载：100/0  |  提交时间：2021/02/02
Embedded image processing technology  Full surface  Granules  Inspection  On-line  Sorting  Soybean seeds  
Atmospheric corrosion assessed from corrosion images using fuzzy Kolmogorov-Sinai entropy 期刊论文
CORROSION SCIENCE, 2017, 卷号: 120, 页码: 251-256
作者:  Xia, Da-Hai;  Ma, Chao;  Song, Shizhe;  Jin, Weixian;  Behnamian, Yashar;  Fan, Hongqiang;  Wang, Jihui;  Gao, Zhiming;  Hu, Wenbin;  Fan, HQ (reprint author), Shanghai Univ, Lab Microstruct, Inst Mat, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China.;  Xia, DH (reprint author), Tianjin Univ, Tianjin Key Lab Composite & Funct Mat, Sch Mat Sci & Engn, Tianjin 300072, Peoples R China.
收藏  |  浏览/下载：123/0  |  提交时间：2017/08/17
Carbon Steel  Weight Loss  Atmospheric Corrosion  Kolmogorov-sinai Entropy  Image Processing  
On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images 期刊论文
Micron, 2009, 卷号: 40, 期号: 2, 页码: 247-254
作者:  X. H. Sang;  K. Du;  M. J. Zhuo;  H. Q. Ye
Adobe PDF(1414Kb)  |  收藏  |  浏览/下载：130/0  |  提交时间：2012/04/13
Scanning Transmission Electron Microscopy  High-angle Annular Dark-field  Image (Haadf)  Image Processing  Quantitative Electron Microscopy  Transmission Electron-microscopy  Dark-field Images  Grain-boundaries  Adf Stem  Chemistry  Silicon  
Digital enhancement of the surface contrast in a conventional HREM image 期刊论文
Ultramicroscopy, 1998, 卷号: 74, 期号: 1-2, 页码: 27-33
作者:  S. Y. Li;  H. Q. Ye
收藏  |  浏览/下载：89/0  |  提交时间：2012/04/14
Plan-view Imaging Of Surfaces  Image Processing  Computer Simulation  High Resolution Electron Microscopy (Hrem)  Ag(110) Surface