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Impact of high interface density on ferroelectric and structural properties of PbZr(0.2)Ti(0.8)O(3)/PbZr(0.4)Ti(0.6)O(3) epitaxial multilayers 期刊论文
Journal of Physics D-Applied Physics, 2009, 卷号: 42, 期号: 8
Authors:  L. Feigl;  S. J. Zheng;  B. I. Birajdar;  B. J. Rodriguez;  Y. L. Zhu;  M. Alexe;  D. Hesse
Adobe PDF(1501Kb)  |  Favorite  |  View/Download：60/0  |  Submit date：2012/04/13
Thin-films  Dislocations  Layer