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Reliable Nonvolatile Memory Black Phosphorus Ferroelectric Field-Effect Transistors with van der Waals Buffer 期刊论文
ACS APPLIED MATERIALS & INTERFACES, 2019, 卷号: 11, 期号: 45, 页码: 42358-42364
Authors:  Yan, Shili;  Huang, Hai;  Xie, Zhijian;  Ye, Guojun;  Li, Xiao-Xi;  Taniguchi, Takashi;  Watanabe, Kenji;  Han, Zheng;  Chen, Xianhui;  Wang, Jianlu;  Chen, Jian-Hao
Favorite  |  View/Download:4/0  |  Submit date:2020/01/06
black phosphorus  P(VDF-TrFE)  nonvolatile ferroelectric memories  field-effect transistors (FETs)  anti-hysteresis