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The role of microstructure on corrosion fatigue behavior of thick-plate Ti-6Al-4V joint via vacuum electron beam welding 期刊论文
VACUUM, 2020, 卷号: 182, 页码: 16
Authors:  Zeng, C. Y.;  Zhang, Y. P.;  Hu, J. L.;  Hou, B.;  Wang, H. Y.;  Dong, Ch L.;  Zhou, Y.
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Titanium alloy  Electron beam welding  Corrosion fatigue behavior  Microstructure  Crack growth  
Oxygen octahedral coupling mediated ferroelectric-antiferroelectric phase transition based on domain wall engineering 期刊论文
ACTA MATERIALIA, 2020, 卷号: 198, 页码: 145-152
Authors:  Geng, W. R.;  Guo, X. W.;  Zhu, Y. L.;  Wang, Y. J.;  Tang, Y. L.;  Han, M. J.;  Feng, Y. P.;  Zou, M. J.;  Wu, B.;  Ma, J. Y.;  Hu, W. T.;  Ma, X. L.
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Ferroelectric films  Ferroelectric domain walls  Antiferroelectric phase transition  Oxygen octahedral coupling  Scanning transmission electron microscopy  
Oxygen octahedral coupling mediated ferroelectric-antiferroelectric phase transition based on domain wall engineering 期刊论文
ACTA MATERIALIA, 2020, 卷号: 198, 页码: 145-152
Authors:  Geng, W. R.;  Guo, X. W.;  Zhu, Y. L.;  Wang, Y. J.;  Tang, Y. L.;  Han, M. J.;  Feng, Y. P.;  Zou, M. J.;  Wu, B.;  Ma, J. Y.;  Hu, W. T.;  Ma, X. L.
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Ferroelectric films  Ferroelectric domain walls  Antiferroelectric phase transition  Oxygen octahedral coupling  Scanning transmission electron microscopy  
Flexoelectricity-induced retention failure in ferroelectric films 期刊论文
ACTA MATERIALIA, 2020, 卷号: 196, 页码: 61-68
Authors:  Zou, M. J.;  Tang, Y. L.;  Zhu, Y. L.;  Wang, Y. J.;  Feng, Y. P.;  Han, M. J.;  Zhang, N. B.;  Ma, J. Y.;  Geng, W. R.;  Hu, W. T.;  Guo, X. W.;  Wu, B.;  Ma, X. L.
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Ferroelectrics  Flexoelectricity  Retention failure  Strain gradient  
Flexoelectricity-induced retention failure in ferroelectric films 期刊论文
ACTA MATERIALIA, 2020, 卷号: 196, 页码: 61-68
Authors:  Zou, M. J.;  Tang, Y. L.;  Zhu, Y. L.;  Wang, Y. J.;  Feng, Y. P.;  Han, M. J.;  Zhang, N. B.;  Ma, J. Y.;  Geng, W. R.;  Hu, W. T.;  Guo, X. W.;  Wu, B.;  Ma, X. L.
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Ferroelectrics  Flexoelectricity  Retention failure  Strain gradient  
Effects of annealing treatment on microstructure and tensile behavior of the Mg-Zn-Y-Nd alloy 期刊论文
JOURNAL OF MAGNESIUM AND ALLOYS, 2020, 卷号: 8, 期号: 3, 页码: 601-613
Authors:  Sheng, L. Y.;  Du, B. N.;  Hu, Z. Y.;  Qiao, Y. X.;  Xiao, Z. P.;  Wang, B. J.;  Xu, D. K.;  Zheng, Y. F.;  Xi, T. F.
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Annealing treatment  Mg-Zn-Y-Nd alloy  Microstructure  Tensile property  
Real-time observation of phase coexistence and a(1)/a(2) to flux-closure domain transformation in ferroelectric films 期刊论文
ACTA MATERIALIA, 2020, 卷号: 193, 页码: 311-317
Authors:  Ma, J. Y.;  Wang, Y. J.;  Zhu, Y. L.;  Tang, Y. L.;  Han, M. J.;  Zou, M. J.;  Feng, Y. P.;  Zhang, N. B.;  Geng, W. R.;  Wu, B.;  Hu, W. T.;  Guo, X. W.;  Zhang, H.;  Ma, X. L.
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Ferroelectric films  Phase coexistence  Phase transformation  Transmission electron microscopy  Phase-field simulation  
Real-time observation of phase coexistence and a(1)/a(2) to flux-closure domain transformation in ferroelectric films 期刊论文
ACTA MATERIALIA, 2020, 卷号: 193, 页码: 311-317
Authors:  Ma, J. Y.;  Wang, Y. J.;  Zhu, Y. L.;  Tang, Y. L.;  Han, M. J.;  Zou, M. J.;  Feng, Y. P.;  Zhang, N. B.;  Geng, W. R.;  Wu, B.;  Hu, W. T.;  Guo, X. W.;  Zhang, H.;  Ma, X. L.
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Ferroelectric films  Phase coexistence  Phase transformation  Transmission electron microscopy  Phase-field simulation  
Unveiling the pinning behavior of charged domain walls in BiFeO3 thin films via vacancy defects 期刊论文
ACTA MATERIALIA, 2020, 卷号: 186, 页码: 68-76
Authors:  Geng, W. R.;  Tian, X. H.;  Jiang, Y. X.;  Zhu, Y. L.;  Tang, Y. L.;  Wang, Y. J.;  Zou, M. J.;  Feng, Y. P.;  Wu, B.;  Hu, W. T.;  Ma, X. L.
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BiFeO3 films  Oxygen vacancy plates  Charged domain wall pinning  Aberration-corrected scanning transmission electron microscopies  Phase field simulations  
Atomic-Scale Investigation of the Borides Precipitated in a Transient Liquid Phase-Bonded Ni-Based Superalloy 期刊论文
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2020, 卷号: 51, 期号: 4, 页码: 10
Authors:  Hu, X. B.;  Sheng, N. C.;  Zhu, Y. M.;  Nie, J. F.;  Liu, J. D.;  Sun, X. F.;  Ma, X. L.
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