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Multi-wafer 3C-SiC heteroepitaxial growth on Si(100) substrates
Sun Guo-Sheng1,2; Liu Xing-Fang1,2; Wang Lei2; Zhao Wan-Shun2; Yang Ting2; Wu Hai-Lei2; Yan Guo-Guo2; Zhao Yong-Mei3; Ning Jin3; Zeng Yi-Ping1,2; Li Jin-Min1,2
Corresponding AuthorSun Guo-Sheng(gshsun@red.semi.ac.cn)
2010-08-01
Source PublicationCHINESE PHYSICS B
ISSN1674-1056
Volume19Issue:8Pages:5
AbstractEpitaxial growth of semiconductor films in multiple-wafer mode is under vigorous development in order to improve yield output to meet the industry increasing demands. Here we report on results of the heteroepitaxial growth of multi-wafer 3C-SiC films on Si(100) substrates by employing a home-made horizontal hot wall low pressure chemical vapour deposition (HWLPCVD) system which was designed to be have a high-throughput, multi-wafer (3x2-inch) capacity. 3C-SiC film properties of the intra-wafer and the wafer-to-wafer including crystalline morphologies, structures and electronics are characterized systematically. The undoped and the moderate NH(3) doped n-type 3C-SiC films with specular surface are grown in the HWLPCVD, thereafter uniformities of intra-wafer thickness and sheet resistance of the 3C-SiC films are obtained to be 6%similar to 7% and 6.7%similar to 8%, respectively, and within a run, the deviations of wafer-to-wafer thickness and sheet resistance are less than 1% and 0.8%, respectively.
Keyword3C-SiC heteroepitaxial multi-wafer uniformity
Funding OrganizationNational Natural Science Foundation of China ; Chinese Academy of Sciences
Indexed BySCI
Language英语
Funding ProjectNational Natural Science Foundation of China[60876003] ; National Natural Science Foundation of China[60606003] ; Chinese Academy of Sciences[yz200702]
WOS Research AreaPhysics
WOS SubjectPhysics, Multidisciplinary
WOS IDWOS:000280741800091
PublisherIOP PUBLISHING LTD
Citation statistics
Cited Times:12[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/101282
Collection中国科学院金属研究所
Corresponding AuthorSun Guo-Sheng
Affiliation1.Chinese Acad Sci, Key Lab Semicond Mat Sci, Inst Semicond, Beijing 100083, Peoples R China
2.Chinese Acad Sci, Ctr Mat Sci, Inst Semicond, Beijing 100083, Peoples R China
3.Chinese Acad Sci, State Key Lab Transducer Technol, Beijing 100083, Peoples R China
Recommended Citation
GB/T 7714
Sun Guo-Sheng,Liu Xing-Fang,Wang Lei,et al. Multi-wafer 3C-SiC heteroepitaxial growth on Si(100) substrates[J]. CHINESE PHYSICS B,2010,19(8):5.
APA Sun Guo-Sheng.,Liu Xing-Fang.,Wang Lei.,Zhao Wan-Shun.,Yang Ting.,...&Li Jin-Min.(2010).Multi-wafer 3C-SiC heteroepitaxial growth on Si(100) substrates.CHINESE PHYSICS B,19(8),5.
MLA Sun Guo-Sheng,et al."Multi-wafer 3C-SiC heteroepitaxial growth on Si(100) substrates".CHINESE PHYSICS B 19.8(2010):5.
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