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Microstructure and transport properties of sol-gel derived highly (100)-oriented lanthanum nickel oxide thin films on SiO2/Si substrate
Zhu, M. W.; Wang, Z. J.; Chen, Y. N.; Zhang, Z. D.
Corresponding AuthorWang, Z. J.(wangzj@imr.ac.cn)
2011-12-01
Source PublicationJOURNAL OF CRYSTAL GROWTH
ISSN0022-0248
Volume336Issue:1Pages:44-49
AbstractIn the present work, lanthanum nickel oxide (LNO) thin films were prepared by the sol-gel method and different thermal treatments were adopted by adjusting the preheating treatment. The microstructure, crystal orientation, chemical composition and electrical properties of LNO films were analyzed to elucidate the relationship between the microstructure and the transport properties of the films. The results show that equiaxed grains predominate the microstructure of the films with pyrolysis step. Without the pyrolysis step, columnar grains are formed in the films, accompanied with an improvement in crystallinity and strengthening of the (100)-orientation. Furthermore, the metal-insulator transition temperature decreases for the films without the pyrolysis step. The effect of film microstructure on its electrical properties was discussed in terms of the existence of internal stress and the improved crystallinity. (C) 2011 Elsevier B.V. All rights reserved.
KeywordCrystal morphology Pyrolysis step Epitaxial growth Sol-gel Lanthanum nickel oxide Electric materials
Funding OrganizationChinese Academy of Sciences ; National Natural Science of Foundation of China ; National Basic Research Program ; Ministry of Science and Technology of China ; Provincial Science of Foundation of Liaoning Province of China ; Research Program of Science and Technology of Shenyang City of China
DOI10.1016/j.jcrysgro.2011.09.050
Indexed BySCI
Language英语
Funding ProjectChinese Academy of Sciences ; National Natural Science of Foundation of China[51072202] ; National Basic Research Program[2010CB934603] ; Ministry of Science and Technology of China ; Provincial Science of Foundation of Liaoning Province of China[20102228] ; Research Program of Science and Technology of Shenyang City of China[P112538]
WOS Research AreaCrystallography ; Materials Science ; Physics
WOS SubjectCrystallography ; Materials Science, Multidisciplinary ; Physics, Applied
WOS IDWOS:000297834800009
PublisherELSEVIER SCIENCE BV
Citation statistics
Cited Times:8[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/105294
Collection中国科学院金属研究所
Corresponding AuthorWang, Z. J.
AffiliationChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Recommended Citation
GB/T 7714
Zhu, M. W.,Wang, Z. J.,Chen, Y. N.,et al. Microstructure and transport properties of sol-gel derived highly (100)-oriented lanthanum nickel oxide thin films on SiO2/Si substrate[J]. JOURNAL OF CRYSTAL GROWTH,2011,336(1):44-49.
APA Zhu, M. W.,Wang, Z. J.,Chen, Y. N.,&Zhang, Z. D..(2011).Microstructure and transport properties of sol-gel derived highly (100)-oriented lanthanum nickel oxide thin films on SiO2/Si substrate.JOURNAL OF CRYSTAL GROWTH,336(1),44-49.
MLA Zhu, M. W.,et al."Microstructure and transport properties of sol-gel derived highly (100)-oriented lanthanum nickel oxide thin films on SiO2/Si substrate".JOURNAL OF CRYSTAL GROWTH 336.1(2011):44-49.
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