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X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10
Wang Youdao; Wu Erdong; Wang Sucheng; Li Wuhui
Corresponding AuthorWu Erdong(ewu@imr.ac.cn)
2011-11-11
Source PublicationACTA METALLURGICA SINICA
ISSN0412-1961
Volume47Issue:11Pages:1418-1425
AbstractThe lattice constants of the matrix phase gamma and the precipitated phase gamma' in a wafer-like nickel-base single crystal superalloy DD10 were determined by four-axis X-ray diffractometer (XRD). The variations of the lattice constants and lattice mismatches of gamma and gamma' phases in the alloy wafer with different thicknesses, i.e., different interphase restriction conditions were obtained. A critical thickness of the alloy wafer to reach an unstable stress state was defined based on the observed changes of lattice mismatch associated with a transformation of stress state from the 3D bulk state to 2D plane state. The lattice mismatches corresponding to different mismatch stress states were calculated. The lattice constants of the gamma and gamma' phases under a relaxed non-mismatch stress state were evaluated based on certain assumptions. The results showed that after the thickness of the alloy wafer reached the critical value, the lattice constant of the gamma' phase decreased linearly with the decrease of the thickness, whereas that of the gamma phase kept nearly constant, resulting in a linear increase of the absolute value of lattice mismatch. Accompanied with the thinning process, the crystal lattice misorientation and the mosaicity increased, the gamma/gamma' interphase restraint reduced and the interphase stress relaxed, and the measured stress state changed to the plane state. The estimated critical thickness and the lattice constants under non-mismatch stress state could provide references for the design of the components and the measurement of the residual stress in the superalloy.
Keywordnickel-base single superalloy lattice constant lattice mismatch XRD
DOI10.3724/SP.J.1037.2011.00307
Indexed BySCI
Language英语
WOS Research AreaMetallurgy & Metallurgical Engineering
WOS SubjectMetallurgy & Metallurgical Engineering
WOS IDWOS:000299492300010
PublisherSCIENCE PRESS
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Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/106198
Collection中国科学院金属研究所
Corresponding AuthorWu Erdong
AffiliationChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Recommended Citation
GB/T 7714
Wang Youdao,Wu Erdong,Wang Sucheng,et al. X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10[J]. ACTA METALLURGICA SINICA,2011,47(11):1418-1425.
APA Wang Youdao,Wu Erdong,Wang Sucheng,&Li Wuhui.(2011).X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10.ACTA METALLURGICA SINICA,47(11),1418-1425.
MLA Wang Youdao,et al."X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10".ACTA METALLURGICA SINICA 47.11(2011):1418-1425.
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