X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10

doi:10.3724/SP.J.1037.2011.00307

IMR OpenIR

	X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10
	Wang Youdao; Wu Erdong; Wang Sucheng; Li Wuhui
通讯作者	Wu Erdong(ewu@imr.ac.cn)
	2011-11-11
发表期刊	ACTA METALLURGICA SINICA
ISSN	0412-1961
卷号	47 期号:11 页码:1418-1425
摘要	The lattice constants of the matrix phase gamma and the precipitated phase gamma' in a wafer-like nickel-base single crystal superalloy DD10 were determined by four-axis X-ray diffractometer (XRD). The variations of the lattice constants and lattice mismatches of gamma and gamma' phases in the alloy wafer with different thicknesses, i.e., different interphase restriction conditions were obtained. A critical thickness of the alloy wafer to reach an unstable stress state was defined based on the observed changes of lattice mismatch associated with a transformation of stress state from the 3D bulk state to 2D plane state. The lattice mismatches corresponding to different mismatch stress states were calculated. The lattice constants of the gamma and gamma' phases under a relaxed non-mismatch stress state were evaluated based on certain assumptions. The results showed that after the thickness of the alloy wafer reached the critical value, the lattice constant of the gamma' phase decreased linearly with the decrease of the thickness, whereas that of the gamma phase kept nearly constant, resulting in a linear increase of the absolute value of lattice mismatch. Accompanied with the thinning process, the crystal lattice misorientation and the mosaicity increased, the gamma/gamma' interphase restraint reduced and the interphase stress relaxed, and the measured stress state changed to the plane state. The estimated critical thickness and the lattice constants under non-mismatch stress state could provide references for the design of the components and the measurement of the residual stress in the superalloy.
关键词	nickel-base single superalloy lattice constant lattice mismatch XRD
DOI	10.3724/SP.J.1037.2011.00307
收录类别	SCI
语种	英语
WOS研究方向	Metallurgy & Metallurgical Engineering
WOS类目	Metallurgy & Metallurgical Engineering
WOS记录号	WOS:000299492300010
出版者	SCIENCE PRESS
引用统计
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/106198
专题	中国科学院金属研究所
通讯作者	Wu Erdong
作者单位	Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
推荐引用方式 GB/T 7714	Wang Youdao,Wu Erdong,Wang Sucheng,et al. X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10[J]. ACTA METALLURGICA SINICA,2011,47(11):1418-1425.
APA	Wang Youdao,Wu Erdong,Wang Sucheng,&Li Wuhui.(2011).X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10.ACTA METALLURGICA SINICA,47(11),1418-1425.
MLA	Wang Youdao,et al."X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10".ACTA METALLURGICA SINICA 47.11(2011):1418-1425.