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Feasibility of applying microsecond-pulse glow discharge time of flight mass spectrometry in surface depth analysis
Su, YX; Yang, PY; Zhou, Z; Wang, XR; Li, FM; Huang, BL; Ren, JS; Chen, M; Ma, HB; Zhang, GS
通讯作者Yang, PY(pyyang@fudan.edu.cn)
1998-09-04
发表期刊SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
ISSN0584-8547
卷号53期号:10页码:1413-1420
摘要This work evaluates the possibilities of applying microsecond-pulse glow discharge time of flight mass spectrometry (mu s-pulse GD-TOFMS) in surface depth analysis. Investigations have been done for effects of discharge pressure on sputtered depth profiles as well as on topographies under mu s-pulse GD mode; and also for influences of discharge current and discharge frequency on characteristics of sputtered surface. Sputtering rates of several pure metals under mu s-pulse GD and dc-GD modes were studied and compared. The estimated erosion rates are 1.27, 2.90 and 5.18 nm s(-1) for pure Fe, Cu and Zn layer, respectively. Depth profiling were conducted for a technical Zr-Fe layer (about 10 mu m) and for a Fe-Cu layer (about 1 mu m) by mu s-pulse GD. A simple model was developed and utilized to convert ion intensity into element concentration, and the experimental results were presented and discussed. Preliminary results show that mu s-pulse GD-TOFMS has a promising future in the area of surface depth analysis, especially in the depth analysis of thin layers and of their cross-sections. (C) 1998 Elsevier Science B.V. All rights reserved.
关键词microsecond pulse glow discharge time of flight mass spectrometry surface analysis
收录类别SCI
语种英语
WOS研究方向Spectroscopy
WOS类目Spectroscopy
WOS记录号WOS:000076320200008
出版者PERGAMON-ELSEVIER SCIENCE LTD
引用统计
被引频次:6[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/107826
专题中国科学院金属研究所
通讯作者Yang, PY
作者单位1.Fudan Univ, Dept Chem, Shanghai 200433, Peoples R China
2.Xiamen Univ, Dept Chem, Analyt Sci Lab, Xiamen 361005, Peoples R China
3.Chinese Acad Sci, Met Res Inst, Shenyang 100015, Peoples R China
推荐引用方式
GB/T 7714
Su, YX,Yang, PY,Zhou, Z,et al. Feasibility of applying microsecond-pulse glow discharge time of flight mass spectrometry in surface depth analysis[J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,1998,53(10):1413-1420.
APA Su, YX.,Yang, PY.,Zhou, Z.,Wang, XR.,Li, FM.,...&Zhang, GS.(1998).Feasibility of applying microsecond-pulse glow discharge time of flight mass spectrometry in surface depth analysis.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,53(10),1413-1420.
MLA Su, YX,et al."Feasibility of applying microsecond-pulse glow discharge time of flight mass spectrometry in surface depth analysis".SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY 53.10(1998):1413-1420.
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