Identification of a new trace 114R SiC by HREM | |
Yang, XY; Shi, GY; Meng, XM; Huang, HL; Wu, YK | |
通讯作者 | Yang, XY() |
1999-04-01 | |
发表期刊 | ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE
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ISSN | 0108-7681 |
卷号 | 55页码:255-257 |
摘要 | Using electron diffraction patterns and high-resolution electron microscopy (HREM), a trace 114R SiC in commercial alpha-SiC powder (mainly 6H SiC according to X-ray diffraction) has been discovered. In a hexagonal unit cell its stacking sequence is [(33)(4)(34)(2)](3), the periodicity along the c axis is 286.14 Angstrom and a = b = 3.073 Angstrom. 114R belongs to the structure series of (33)n34(33)m34 predicted theoretically by Pandey & Krishna [Mater. Sci. Eng. (1975), 20, 243-249] on the basis of the faulted matrix model. |
收录类别 | SCI |
语种 | 英语 |
WOS研究方向 | Crystallography |
WOS类目 | Crystallography |
WOS记录号 | WOS:000079998300016 |
出版者 | MUNKSGAARD INT PUBL LTD |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.imr.ac.cn/handle/321006/109502 |
专题 | 中国科学院金属研究所 |
通讯作者 | Yang, XY |
作者单位 | 1.Chinese Acad Sci, Met Res Inst, Atom Imaging Solids Lab, Shenyang 110015, Peoples R China 2.Liaoning Univ, Dept Elect Sci & Engn, Shenyang 110036, Peoples R China |
推荐引用方式 GB/T 7714 | Yang, XY,Shi, GY,Meng, XM,et al. Identification of a new trace 114R SiC by HREM[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE,1999,55:255-257. |
APA | Yang, XY,Shi, GY,Meng, XM,Huang, HL,&Wu, YK.(1999).Identification of a new trace 114R SiC by HREM.ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE,55,255-257. |
MLA | Yang, XY,et al."Identification of a new trace 114R SiC by HREM".ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE 55(1999):255-257. |
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