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Identification of a new trace 114R SiC by HREM
Yang, XY; Shi, GY; Meng, XM; Huang, HL; Wu, YK
通讯作者Yang, XY()
1999-04-01
发表期刊ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE
ISSN0108-7681
卷号55页码:255-257
摘要Using electron diffraction patterns and high-resolution electron microscopy (HREM), a trace 114R SiC in commercial alpha-SiC powder (mainly 6H SiC according to X-ray diffraction) has been discovered. In a hexagonal unit cell its stacking sequence is [(33)(4)(34)(2)](3), the periodicity along the c axis is 286.14 Angstrom and a = b = 3.073 Angstrom. 114R belongs to the structure series of (33)n34(33)m34 predicted theoretically by Pandey & Krishna [Mater. Sci. Eng. (1975), 20, 243-249] on the basis of the faulted matrix model.
收录类别SCI
语种英语
WOS研究方向Crystallography
WOS类目Crystallography
WOS记录号WOS:000079998300016
出版者MUNKSGAARD INT PUBL LTD
引用统计
被引频次:2[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/109502
专题中国科学院金属研究所
通讯作者Yang, XY
作者单位1.Chinese Acad Sci, Met Res Inst, Atom Imaging Solids Lab, Shenyang 110015, Peoples R China
2.Liaoning Univ, Dept Elect Sci & Engn, Shenyang 110036, Peoples R China
推荐引用方式
GB/T 7714
Yang, XY,Shi, GY,Meng, XM,et al. Identification of a new trace 114R SiC by HREM[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE,1999,55:255-257.
APA Yang, XY,Shi, GY,Meng, XM,Huang, HL,&Wu, YK.(1999).Identification of a new trace 114R SiC by HREM.ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE,55,255-257.
MLA Yang, XY,et al."Identification of a new trace 114R SiC by HREM".ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE 55(1999):255-257.
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