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Identification of a new trace 114R SiC by HREM
Yang, XY; Shi, GY; Meng, XM; Huang, HL; Wu, YK
Corresponding AuthorYang, XY()
1999-04-01
Source PublicationACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE
ISSN0108-7681
Volume55Pages:255-257
AbstractUsing electron diffraction patterns and high-resolution electron microscopy (HREM), a trace 114R SiC in commercial alpha-SiC powder (mainly 6H SiC according to X-ray diffraction) has been discovered. In a hexagonal unit cell its stacking sequence is [(33)(4)(34)(2)](3), the periodicity along the c axis is 286.14 Angstrom and a = b = 3.073 Angstrom. 114R belongs to the structure series of (33)n34(33)m34 predicted theoretically by Pandey & Krishna [Mater. Sci. Eng. (1975), 20, 243-249] on the basis of the faulted matrix model.
Indexed BySCI
Language英语
WOS Research AreaCrystallography
WOS SubjectCrystallography
WOS IDWOS:000079998300016
PublisherMUNKSGAARD INT PUBL LTD
Citation statistics
Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/109502
Collection中国科学院金属研究所
Corresponding AuthorYang, XY
Affiliation1.Chinese Acad Sci, Met Res Inst, Atom Imaging Solids Lab, Shenyang 110015, Peoples R China
2.Liaoning Univ, Dept Elect Sci & Engn, Shenyang 110036, Peoples R China
Recommended Citation
GB/T 7714
Yang, XY,Shi, GY,Meng, XM,et al. Identification of a new trace 114R SiC by HREM[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE,1999,55:255-257.
APA Yang, XY,Shi, GY,Meng, XM,Huang, HL,&Wu, YK.(1999).Identification of a new trace 114R SiC by HREM.ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE,55,255-257.
MLA Yang, XY,et al."Identification of a new trace 114R SiC by HREM".ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE 55(1999):255-257.
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