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Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy
Ong, HC; Dai, JY; Hung, KC; Chan, YC; Chang, RPH; Ho, ST
Corresponding AuthorOng, HC()
2000-09-04
Source PublicationAPPLIED PHYSICS LETTERS
ISSN0003-6951
Volume77Issue:10Pages:1484-1486
AbstractThe microstructure of polycrystalline ZnO thin films grown on amorphous fused quartz has been studied by transmission electron microscopy and electron energy loss spectroscopy (EELS). The optical functions of the grain and grain boundary of ZnO acquired from EELS are compared to elucidate the mechanism of the formation of self-assemble laser cavities within this material. It is found that the refractive index of the grain boundary is significantly lower than that of the grain due to the lack of excitonic resonance. This large refractive index difference between the grain and grain boundary substantiates the scenario that the formation of laser cavities is caused by the strong optical scattering facilitated in a highly disordered crystalline structure. In addition, our results also imply that the optical characteristics of ZnO have very high tolerance on defects. (C) 2000 American Institute of Physics. [S0003-6951(00)01636-3].
Indexed BySCI
Language英语
WOS Research AreaPhysics
WOS SubjectPhysics, Applied
WOS IDWOS:000089017200025
PublisherAMER INST PHYSICS
Citation statistics
Cited Times:21[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/111289
Collection中国科学院金属研究所
Corresponding AuthorOng, HC
Affiliation1.City Univ Hong Kong, Dept Elect Engn, Hong Kong, Hong Kong, Peoples R China
2.Chinese Acad Sci, Inst Met Res, Beijing 100864, Peoples R China
3.Northwestern Univ, Dept Elect & Comp Engn, Evanston, IL 60208 USA
Recommended Citation
GB/T 7714
Ong, HC,Dai, JY,Hung, KC,et al. Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy[J]. APPLIED PHYSICS LETTERS,2000,77(10):1484-1486.
APA Ong, HC,Dai, JY,Hung, KC,Chan, YC,Chang, RPH,&Ho, ST.(2000).Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy.APPLIED PHYSICS LETTERS,77(10),1484-1486.
MLA Ong, HC,et al."Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy".APPLIED PHYSICS LETTERS 77.10(2000):1484-1486.
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