Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy

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	Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy
	Ong, HC ; Dai, JY ; Hung, KC ; Chan, YC ; Chang, RPH ; Ho, ST
通讯作者	Ong, HC()
	2000-09-04
发表期刊	APPLIED PHYSICS LETTERS
ISSN	0003-6951
卷号	77 期号:10 页码:1484-1486
摘要	The microstructure of polycrystalline ZnO thin films grown on amorphous fused quartz has been studied by transmission electron microscopy and electron energy loss spectroscopy (EELS). The optical functions of the grain and grain boundary of ZnO acquired from EELS are compared to elucidate the mechanism of the formation of self-assemble laser cavities within this material. It is found that the refractive index of the grain boundary is significantly lower than that of the grain due to the lack of excitonic resonance. This large refractive index difference between the grain and grain boundary substantiates the scenario that the formation of laser cavities is caused by the strong optical scattering facilitated in a highly disordered crystalline structure. In addition, our results also imply that the optical characteristics of ZnO have very high tolerance on defects. (C) 2000 American Institute of Physics. [S0003-6951(00)01636-3].
收录类别	SCI
语种	英语
WOS研究方向	Physics
WOS类目	Physics, Applied
WOS记录号	WOS:000089017200025
出版者	AMER INST PHYSICS
引用统计	被引频次：23[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/111289
专题	中国科学院金属研究所
通讯作者	Ong, HC
作者单位	1.City Univ Hong Kong, Dept Elect Engn, Hong Kong, Hong Kong, Peoples R China 2.Chinese Acad Sci, Inst Met Res, Beijing 100864, Peoples R China 3.Northwestern Univ, Dept Elect & Comp Engn, Evanston, IL 60208 USA
推荐引用方式 GB/T 7714	Ong, HC,Dai, JY,Hung, KC,et al. Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy[J]. APPLIED PHYSICS LETTERS,2000,77(10):1484-1486.
APA	Ong, HC,Dai, JY,Hung, KC,Chan, YC,Chang, RPH,&Ho, ST.(2000).Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy.APPLIED PHYSICS LETTERS,77(10),1484-1486.
MLA	Ong, HC,et al."Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy".APPLIED PHYSICS LETTERS 77.10(2000):1484-1486.