Low temperature creep of nanocrystalline pure copper | |
Cai, B; Kong, QP; Lu, L; Lu, K | |
通讯作者 | Kong, QP() |
2000-06-30 | |
发表期刊 | MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
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ISSN | 0921-5093 |
卷号 | 286期号:1页码:188-192 |
摘要 | Tensile creep of nano-grained pure Cu with an average grain size of 30 mm prepared by electrodeposition technique has been investigated in the temperature range 20-50 degrees C (0.22-0.24 T-m). The steady state creep rate is found to be proportional to the effective stress sigma(e) = (sigma - sigma(0)), where sigma is the applied stress, and sigma(0) is the threshold stress. The activation energy for the creep is measured to be 0.72 eV, which is close to that for grain boundary diffusion in nano-grained Cu. The creep rates are found to be of the same order of magnitude as those calculated from the equation for Coble creep. The existence of threshold stress implies that the grain boundaries do not act as perfect sources and sinks of atoms (or vacancies). The results suggest that the creep can be attributed to the 'interface controlled diffusional creep'. (C) 2000 Elsevier Science S.A. All rights reserved. |
关键词 | nanocrystalline materials creep grain boundary diffusion |
收录类别 | SCI |
语种 | 英语 |
WOS研究方向 | Science & Technology - Other Topics ; Materials Science ; Metallurgy & Metallurgical Engineering |
WOS类目 | Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering |
WOS记录号 | WOS:000088914700034 |
出版者 | ELSEVIER SCIENCE SA |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.imr.ac.cn/handle/321006/111308 |
专题 | 中国科学院金属研究所 |
通讯作者 | Kong, QP |
作者单位 | 1.Chinese Acad Sci, Inst Solid State Phys, Internal Frict & Defects Solids Lab, Hefei 230031, Peoples R China 2.Chinese Acad Sci, Inst Mat Res, State Key Lab RSA, Shenyang 110015, Peoples R China |
推荐引用方式 GB/T 7714 | Cai, B,Kong, QP,Lu, L,et al. Low temperature creep of nanocrystalline pure copper[J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,2000,286(1):188-192. |
APA | Cai, B,Kong, QP,Lu, L,&Lu, K.(2000).Low temperature creep of nanocrystalline pure copper.MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,286(1),188-192. |
MLA | Cai, B,et al."Low temperature creep of nanocrystalline pure copper".MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING 286.1(2000):188-192. |
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