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The structural, dielectric and ferroelectric properties of Bi3.5La0.5Ti3O12 thin films prepared by sol-gel process
Zhu, JG; Yu, C; Xiao, DQ; Shen, L; Yuan, XW; Zhu, JL; Yue, X
Corresponding AuthorZhu, JG()
2001
Source PublicationFERROELECTRICS
ISSN0015-0193
Volume260Issue:1-4Pages:499-504
AbstractLanthanum doped bismuth titanate (Bi3.5La0.5Ti3O12, BLT-5) thin films were prepared by sol-gel method. Polycrystalline BLT-5 thin films could be obtained at annealing temperatures of 600similar to650 degreesC. The typical coercive electric field (E) and remnant polarization (P,) for the BLT-5 thin film annealed at 650degreesC were E-C=67 kV/cm, P-r =11.2 mu C/cm(2), respectively. BLT-5 thin film shows good fatigue-free property.
Keywordbismuth titanate lanthanum doped sol-gel
Indexed BySCI
Language英语
WOS Research AreaMaterials Science ; Physics
WOS SubjectMaterials Science, Multidisciplinary ; Physics, Condensed Matter
WOS IDWOS:000177215300027
PublisherTAYLOR & FRANCIS LTD
Citation statistics
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/112007
Collection中国科学院金属研究所
Corresponding AuthorZhu, JG
Affiliation1.Sichuan Univ, Dept Mat Sci, Chengdu 610064, Peoples R China
2.Acad Sinica, Int Ctr Mat Phys, Shenyang 110015, Peoples R China
Recommended Citation
GB/T 7714
Zhu, JG,Yu, C,Xiao, DQ,et al. The structural, dielectric and ferroelectric properties of Bi3.5La0.5Ti3O12 thin films prepared by sol-gel process[J]. FERROELECTRICS,2001,260(1-4):499-504.
APA Zhu, JG.,Yu, C.,Xiao, DQ.,Shen, L.,Yuan, XW.,...&Yue, X.(2001).The structural, dielectric and ferroelectric properties of Bi3.5La0.5Ti3O12 thin films prepared by sol-gel process.FERROELECTRICS,260(1-4),499-504.
MLA Zhu, JG,et al."The structural, dielectric and ferroelectric properties of Bi3.5La0.5Ti3O12 thin films prepared by sol-gel process".FERROELECTRICS 260.1-4(2001):499-504.
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