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Scanning tunneling microscopy observation to formation procedure of nano-Ti film
Xie, TS; Du, H; Meng, XM; Sun, C; Wen, LS
通讯作者Xie, TS(tsxie@imr.ac.cn)
2001-02-18
发表期刊ACTA METALLURGICA SINICA
ISSN0412-1961
卷号37期号:2页码:113-117
摘要Nano-Ti films with different thicknesses were deposited on polymer film substrate by magnetron sputtering. Scanning tunneling microscopy (STM) was used to study the structural characteristic. The results show that the film formed at the initial stage is composed of nuclei particles with diameter less than 2 nn and some particle accumulations. With increasing the sputtering time the deposited particles become island-like and then form Ti film consisted of nano particles. The average grain size increases with increasing thickness of film. The influences of substrate and magnetron sputtering conditions on the film structure were discussed.
关键词magnetron sputtering nano-Ti film scanning tunneling microscopy (STM)
收录类别SCI
语种英语
WOS研究方向Metallurgy & Metallurgical Engineering
WOS类目Metallurgy & Metallurgical Engineering
WOS记录号WOS:000172766300001
出版者SCIENCE CHINA PRESS
引用统计
被引频次:5[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/113426
专题中国科学院金属研究所
通讯作者Xie, TS
作者单位Chinese Acad Sci, Inst Met Res, Atom Imaging Solids Lab, Shenyang 110016, Peoples R China
推荐引用方式
GB/T 7714
Xie, TS,Du, H,Meng, XM,et al. Scanning tunneling microscopy observation to formation procedure of nano-Ti film[J]. ACTA METALLURGICA SINICA,2001,37(2):113-117.
APA Xie, TS,Du, H,Meng, XM,Sun, C,&Wen, LS.(2001).Scanning tunneling microscopy observation to formation procedure of nano-Ti film.ACTA METALLURGICA SINICA,37(2),113-117.
MLA Xie, TS,et al."Scanning tunneling microscopy observation to formation procedure of nano-Ti film".ACTA METALLURGICA SINICA 37.2(2001):113-117.
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