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The Fourier transformation of X-ray diffraction profiles
Liu, G; Liang, ZD; Lu, K
Corresponding AuthorLiu, G()
2002-01-18
Source PublicationACTA METALLURGICA SINICA
ISSN0412-1961
Volume38Issue:1Pages:109-112
AbstractComputer-aided experimental technique was adopted to analysis the variance regularity of Fourier coefficients in the Stokes correction of X-ray diffraction profile. The hook effect occurs when the experimental profiles approach Gauss distribution. The Fourier transforms may result in spurious oscillations and more broadening of the real profile, which can be eliminated by introducing a critical condition. The Fourier coefficients obtained from the Stokes correction of K-alpha doublet profile axe found to deviate from the real values obtained from that of singlet profile, which may be refined through the Fourier transformation of the deconvoluted (real) profile.
KeywordX-ray diffraction profile Fourier transformation refinement of Fourier coefficient
Indexed BySCI
Language英语
WOS Research AreaMetallurgy & Metallurgical Engineering
WOS SubjectMetallurgy & Metallurgical Engineering
WOS IDWOS:000173742700021
PublisherSCIENCE CHINA PRESS
Citation statistics
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/115184
Collection中国科学院金属研究所
Corresponding AuthorLiu, G
Affiliation1.Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China
2.Northeastern Univ, Dept Mat Sci & Engn, Shenyang 110004, Peoples R China
Recommended Citation
GB/T 7714
Liu, G,Liang, ZD,Lu, K. The Fourier transformation of X-ray diffraction profiles[J]. ACTA METALLURGICA SINICA,2002,38(1):109-112.
APA Liu, G,Liang, ZD,&Lu, K.(2002).The Fourier transformation of X-ray diffraction profiles.ACTA METALLURGICA SINICA,38(1),109-112.
MLA Liu, G,et al."The Fourier transformation of X-ray diffraction profiles".ACTA METALLURGICA SINICA 38.1(2002):109-112.
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