| Self-ion bombarded Cr films: Crystallographic orientation and oxidation behaviour | |
| Hu, Ming1,2; Shen, Mingli3; Liu, Zhengliang3; Guo, Cean2,3; Li, Qiang1; Zhu, Shenglong3 | |
| Corresponding Author | Shen, Mingli(mlshen@imr.ac.cn) ; Li, Qiang(liqiang1971@163.com) |
| 2018-10-01 | |
| Source Publication | CORROSION SCIENCE
 |
| ISSN | 0010-938X |
| Volume | 143Pages:212-220 |
| Abstract | Low-energy self-ion bombardment effects on the crystallographic orientation and oxidation behaviours of arc ion-plated pure Cr films were investigated. Microstructurally compact Cr films as observed by SEM were obtained under ion-bombardment energy of 50-250 eV. Stronger ion bombardment induced crystallographic orientation of Cr (200) and slight self-sputtering effect in the Cr films. Oxidation of the Cr films at 900 degrees C showed that the stronger self-ion bombardment induced formation of the more compact chromia scales with significantly lowered growth rate, indicating that self-ion bombardment can be an effective approach to improve the oxidation resistance of metal films. |
| Keyword | Chromium Metal coatings Oxidation Inclusion Interfaces |
| Funding Organization | National Natural Science Foundation of China ; National key Basic Research Program of China (973 Program) ; National High-tech Research and Development Program (863 Program) |
| DOI | 10.1016/j.corsci.2018.08.016 |
| Indexed By | SCI |
| Language | 英语 |
| Funding Project | National Natural Science Foundation of China[51301185] ; National key Basic Research Program of China (973 Program)[2012CB625100] ; National High-tech Research and Development Program (863 Program)[2012AA03A512] |
| WOS Research Area | Materials Science ; Metallurgy & Metallurgical Engineering |
| WOS Subject | Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering |
| WOS ID | WOS:000447570500022 |
| Publisher | PERGAMON-ELSEVIER SCIENCE LTD |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/129798 |
| Collection | 中国科学院金属研究所 |
| Corresponding Author | Shen, Mingli; Li, Qiang |
| Affiliation | 1.North Univ China, Sch Mechatron Engn, 3 Xueyuan Rd, Taiyuan 030051, Shanxi, Peoples R China 2.Shenyang Ligong Univ, Sch Equipment Engn, 6 Nanpingzhong Rd, Shenyang 110159, Liaoning, Peoples R China 3.Chinese Acad Sci, Inst Met Res, Corros & Protect Div, Shenyang Natl Lab Mat Sci, 62 Wencui Rd, Shenyang 110016, Liaoning, Peoples R China |
| Recommended Citation GB/T 7714 | Hu, Ming,Shen, Mingli,Liu, Zhengliang,et al. Self-ion bombarded Cr films: Crystallographic orientation and oxidation behaviour[J]. CORROSION SCIENCE,2018,143:212-220. |
| APA | Hu, Ming,Shen, Mingli,Liu, Zhengliang,Guo, Cean,Li, Qiang,&Zhu, Shenglong.(2018).Self-ion bombarded Cr films: Crystallographic orientation and oxidation behaviour.CORROSION SCIENCE,143,212-220. |
| MLA | Hu, Ming,et al."Self-ion bombarded Cr films: Crystallographic orientation and oxidation behaviour".CORROSION SCIENCE 143(2018):212-220. |
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