IMR OpenIR
Revealing the maximum microhardness and thickness of hardened layers for copper with various grain sizes
Ren, C. X.1,2; Wang, Q.1; Hou, J. P.1; Zhang, Z. J.1; Yang, H. J.1; Zhang, Z. F.1,2
Corresponding AuthorWang, Q.(gmwang@imr.ac.cn) ; Zhang, Z. F.(zhfzhang@imr.ac.cn)
2020-03-19
Source PublicationMATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
ISSN0921-5093
Volume778Pages:6
AbstractSurface strengthened Cu samples with ultra-fine grain (UFG), fine grain (FG), and coarse grain (CG) matrixes were prepared by cold-rolling, controlled annealing, and then treated by surface spinning strengthening (3S) to reveal the effect of grain size on the feature of the hardened layer. The results indicate that the maximum microhardness of the hardened layer was slightly affected by grain size. The thickness of the hardened layer is significantly influenced by grain size. When decreasing the grain size of matrix from CG to UFG, the thickness of the hardened layer displays an increasing then deceasing trend, and approaches in the highest thickness at FG.
KeywordCu Gradient microstructure Hardened layer Microhardness Grain size
Funding OrganizationNational Natural Science Foundation of China (NSFC) ; LiaoNing Revitalization Talents Program
DOI10.1016/j.msea.2020.139113
Indexed BySCI
Language英语
Funding ProjectNational Natural Science Foundation of China (NSFC)[U1664253] ; National Natural Science Foundation of China (NSFC)[51331007] ; LiaoNing Revitalization Talents Program[XLYC1808027]
WOS Research AreaScience & Technology - Other Topics ; Materials Science ; Metallurgy & Metallurgical Engineering
WOS SubjectNanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
WOS IDWOS:000524352200016
PublisherELSEVIER SCIENCE SA
Citation statistics
Cited Times:3[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/138163
Collection中国科学院金属研究所
Corresponding AuthorWang, Q.; Zhang, Z. F.
Affiliation1.Chinese Acad Sci, Inst Met Res, Lab Fatigue & Fracture Mat, Shenyang 110016, Peoples R China
2.Univ Sci & Technol China, Sch Mat Sci & Engn, Hefei 230026, Peoples R China
Recommended Citation
GB/T 7714
Ren, C. X.,Wang, Q.,Hou, J. P.,et al. Revealing the maximum microhardness and thickness of hardened layers for copper with various grain sizes[J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,2020,778:6.
APA Ren, C. X.,Wang, Q.,Hou, J. P.,Zhang, Z. J.,Yang, H. J.,&Zhang, Z. F..(2020).Revealing the maximum microhardness and thickness of hardened layers for copper with various grain sizes.MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,778,6.
MLA Ren, C. X.,et al."Revealing the maximum microhardness and thickness of hardened layers for copper with various grain sizes".MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING 778(2020):6.
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