IMR OpenIR
Al—Li合金中缺陷和电子密度的正电子寿命谱
吴伟明; 高英俊; 邓文; 罗里熊; 许少杰; 钟夏平; 蒋晓军
1997
Source Publication中国有色金属学报
ISSN1004-0609
Volume7.0Issue:004Pages:123-126
Abstract在深低温在室温同温度下,测量了不同时效状态的Al-Li-Cu-Mg-Zr合金和含Zn、Ag或Sc的合金的正电子寿命谱。分析表明;峰值时效使热空位大量回复并使基体电子密度提高。
Keyword正电子寿命谱 缺陷 铝合金 电子密度
Indexed ByCSCD
Language中文
CSCD IDCSCD:412849
Citation statistics
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/144499
Collection中国科学院金属研究所
Affiliation中国科学院金属研究所
Recommended Citation
GB/T 7714
吴伟明,高英俊,邓文,等. Al—Li合金中缺陷和电子密度的正电子寿命谱[J]. 中国有色金属学报,1997,7.0(004):123-126.
APA 吴伟明.,高英俊.,邓文.,罗里熊.,许少杰.,...&蒋晓军.(1997).Al—Li合金中缺陷和电子密度的正电子寿命谱.中国有色金属学报,7.0(004),123-126.
MLA 吴伟明,et al."Al—Li合金中缺陷和电子密度的正电子寿命谱".中国有色金属学报 7.0.004(1997):123-126.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[吴伟明]'s Articles
[高英俊]'s Articles
[邓文]'s Articles
Baidu academic
Similar articles in Baidu academic
[吴伟明]'s Articles
[高英俊]'s Articles
[邓文]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[吴伟明]'s Articles
[高英俊]'s Articles
[邓文]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.