Al—Li合金中缺陷和电子密度的正电子寿命谱

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	Al—Li合金中缺陷和电子密度的正电子寿命谱
	吴伟明; 高英俊; 邓文; 罗里熊; 许少杰; 钟夏平; 蒋晓军
	1997
Source Publication	中国有色金属学报
ISSN	1004-0609
Volume	7.0 Issue:004 Pages:123-126
Abstract	在深低温在室温同温度下，测量了不同时效状态的Ａｌ－Ｌｉ－Ｃｕ－Ｍｇ－Ｚｒ合金和含Ｚｎ、Ａｇ或Ｓｃ的合金的正电子寿命谱。分析表明；峰值时效使热空位大量回复并使基体电子密度提高。
Keyword	正电子寿命谱缺陷铝合金电子密度
Indexed By	CSCD
Language	中文
CSCD ID	CSCD:412849
Citation statistics	Cited Times:4[CSCD] [CSCD Record]
Document Type	期刊论文
Identifier	http://ir.imr.ac.cn/handle/321006/144499
Collection	中国科学院金属研究所
Affiliation	中国科学院金属研究所
Recommended Citation GB/T 7714	吴伟明,高英俊,邓文,等. Al—Li合金中缺陷和电子密度的正电子寿命谱[J]. 中国有色金属学报,1997,7.0(004):123-126.
APA	吴伟明.,高英俊.,邓文.,罗里熊.,许少杰.,...&蒋晓军.(1997).Al—Li合金中缺陷和电子密度的正电子寿命谱.中国有色金属学报,7.0(004),123-126.
MLA	吴伟明,et al."Al—Li合金中缺陷和电子密度的正电子寿命谱".中国有色金属学报 7.0.004(1997):123-126.

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