X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films

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	X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films
其他题名	X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films
	Li YongHua 1; Meng FanLing 1; Liu ChangSheng 3; Zheng WeiTao 2; Wang YuMing 2
	2009
发表期刊	ACTA PHYSICA SINICA
ISSN	1000-3290
卷号	58 期号:4 页码:2742-2745
摘要	The effect of thickness on transformation temperuture of the NiTi thin films has been studied by X-ray diffraction and X-ray photoelectron spectroscopy. Results show that the crystallization temperature for 3 mu m-thick film is higher than that for 18 mu m thick film at the same growth temperature and post annealing. With the substrate temperature increasing, the start temperature (A(s)) of austenite phase is lowered after annealing at 763 K for 1 h. There is an oxide layer (TiO2) on the film surface, which prevents the Ni atom from coming onto the surface. There is an oxide layer of a mixture Ti2O3 with NiO on the film /substrate interface. The oxide layers affect the transformation temperature by changing the Ni atomic content in the interior of the film.
关键词	MARTENSITIC-TRANSFORMATION OXIDATION BEHAVIOR PHASE NiTi alloy film X-ray diffraction phase transformation X-ray photoelectron spectroscopy
收录类别	CSCD
语种	英语
资助项目	[Harbin Engineering University, China] ; [National Science Foundation for Post-doctoral Scientists of China] ; [Post-doctoral Sustentation Fund of Heilongjiang Province, China]
CSCD记录号	CSCD:3540652
引用统计	被引频次：1[CSCD] [CSCD记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/147240
专题	中国科学院金属研究所
作者单位	1.Harbin Engn University, Sch Sci, Natl Key Lab Technol AUVs, Harbin 150001, Peoples R China 2.中山大学 3.中国科学院金属研究所
推荐引用方式 GB/T 7714	Li YongHua,Meng FanLing,Liu ChangSheng,et al. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films[J]. ACTA PHYSICA SINICA,2009,58(4):2742-2745.
APA	Li YongHua,Meng FanLing,Liu ChangSheng,Zheng WeiTao,&Wang YuMing.(2009).X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films.ACTA PHYSICA SINICA,58(4),2742-2745.
MLA	Li YongHua,et al."X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films".ACTA PHYSICA SINICA 58.4(2009):2742-2745.