| 异质界面调控超薄PbTiO_3薄膜四方性的研究 | |
| Alternative Title | Study of tetragonality in ultrathin PbTiO_3 films driven by heterointerface |
| 张思瑞; 唐云龙; 朱银莲; 李爽; 马秀良 | |
| 2018 | |
| Source Publication | 电子显微学报
 |
| ISSN | 1000-6281 |
| Volume | 37.0Issue:004Pages:321-325 |
| Abstract | 本文利用球差校正透射电子显微镜研究了异质界面结构对PbTiO_3/La_（0.7）Sr_（0.3）MnO_3/NdGaO_3（110）_O以及PbTiO_3/NdGaO_3（110）_O超薄薄膜体系中铁电PbTiO_3层四方性的影响。结果表明,在NdGaO_3（110）_O衬底上生长的具有化学价态不连续异质界面（La_（0.7）Sr_（0.3）MnO_3/PbTiO_3）的PbTiO_3薄膜体系中四方性比直接在NdGaO_3（110）_O衬底上生长超薄PbTiO_3薄膜的四方性明显增强,XPS谱分析显示出界面Mn元素价态发生了变价,探讨了界面处化学价态的变化对薄膜四方性的影响。 |
| Other Abstract | Aberration-corrected scanning transmission electron microscopy was applied to investigate two different film systems. It is found that when ultrathin PbTiO_3 films grow on the NdGaO_3 substrate buffered with La_（0. 7）Sr_（0. 3）MnO_3 electrode,the tetragonality is improved compared with PbTiO_3 films grown on NdGaO_3 substrates directly. It is owing to the accumulation of oxygen vacancies at the heterointerface between La_（0. 7）Sr_（0. 3）MnO_3 and PbTiO_3,induced by charge transfer of Mn valence reduction as evidenced by XPS analysis.The results may facilitate the development of nanoscale ferroelectric materials. |
| Keyword | 铁电薄膜 异质界面 四方性提高 球差校正透射电子显微镜 |
| Indexed By | CSCD |
| Language | 中文 |
| CSCD ID | CSCD:6306454 |
| Citation statistics |
Cited Times:2[CSCD]
[CSCD Record]
|
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/149006 |
| Collection | 中国科学院金属研究所 |
| Affiliation | 中国科学院金属研究所 |
| Recommended Citation GB/T 7714 | 张思瑞,唐云龙,朱银莲,等. 异质界面调控超薄PbTiO_3薄膜四方性的研究[J]. 电子显微学报,2018,37.0(004):321-325. |
| APA | 张思瑞,唐云龙,朱银莲,李爽,&马秀良.(2018).异质界面调控超薄PbTiO_3薄膜四方性的研究.电子显微学报,37.0(004),321-325. |
| MLA | 张思瑞,et al."异质界面调控超薄PbTiO_3薄膜四方性的研究".电子显微学报 37.0.004(2018):321-325. |
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